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| Enquiries: please contact 01372 378822 or use our enquiry form
KLA Tencor the world's leading supplier of process control and yield management solutions for the semiconductor and related industries, has acquired Ambios Technology, a leading manufacturer of high-resolution surface metrology systems.
The new, integrated product suite will enable customers to select the best combination of performance and price required for their research or production needs. | |
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Xi-100 Non-Contact Optical Profiler
The Xi-100 Non-Contact Optical Interferometer quickly and accurately measures the 3D topography of surfaces at the nanometer level. It is designed for the researcher who is interested in getting fast, repeatable date from an instrument that is not encumbered by unneeded levels of complication. Rapidly image areas in scale from microns to millimeters and the only instrument adjustments are sample position and focus.
Main features:
 | Fast, non-destructive, 3-dimensional measurements
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| Point and shoot operation
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| High resolution, accuracy, and repeatability on smooth or rough surfaces
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| Highly affordable |
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