PRODUCTS:
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 Surface Metrology, Thin F...
 Nanotechnology, SPM, AFM
 Biotechnology/Medical Imag...
 Cryogenics and Magnetics
 Photovoltaics Applications
 Semiconductor applications








Enquiries: please contact 01372 378822 or use our enquiry form

KLA Tencor the world's leading supplier of process control and yield management solutions for the semiconductor and related industries, has acquired Ambios Technology, a leading manufacturer of high-resolution surface metrology systems.

The new, integrated product suite will enable customers to select the best combination of performance and price required for their research or production needs.



Xi-100 Non-Contact Optical Profiler



The Xi-100 Non-Contact Optical Interferometer quickly and accurately measures the 3D topography of surfaces at the nanometer level. It is designed for the researcher who is interested in getting fast, repeatable date from an instrument that is not encumbered by unneeded levels of complication. Rapidly image areas in scale from microns to millimeters and the only instrument adjustments are sample position and focus.

Main features:
Fast, non-destructive, 3-dimensional measurements
Point and shoot operation
High resolution, accuracy, and repeatability on smooth or rough surfaces
Highly affordable



PDF Download
Xi-100 Plus Brochure (PDF, 531 KB)



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LOT-Oriel UK
E-mail: info@lotoriel.co.uk

1 Mole Business Park
Leatherhead, Surrey, KT22 7BA

Phone: 01372 378822
Fax: 01372 375353


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