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α-SE™ – Spectroscopic Ellipsometry has never been easier The Alpha SE™ Ellipsometer makes SE measurements fast, simple & cost effective. The Alpha-SE™ will measure both thickness and index with the use of the CompleteEASE™ software. With the compact, fully integrated design and USB connection make the ultimate table top tool. Easy-to-use... push button operation with advanced software that takes care of the work for you. Flexible... work with your materials - dielectrics, semiconductors, organics...

Powerful... proven SE technology gives you both thickness and index without the uncertainty of single wavelength Ellipsometry or spectrophotometry.

Low Cost... the power of SE at a much lower cost than a high-level research tool. Fast - 100s of wavelengths simultaneously collected in seconds - immediate results.

Do you need to measure thin film thickness and refractive index as fast and as simple as possible?

For more information please contact Heath Young on 01372 378822, e-mail heath@lotoriel.co.uk.

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Alpha SE brochure (PDF, 1,1 MB)

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Alpha-SE Video (WMV, 1,3 MB)

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Spectroscopic Ellipsometers

Alpha-SE

Photovoltaic Applications

Software

T-Solar Ellipsometer for Photovoltaic Applications

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α-SE™ – Spectroscopic Ellipsometry has never been easier

Do you need to measure thin film thickness and refractive index as fast and as simple as possible?

α-SE™ –
Spectroscopic Ellipsometry has never been easier