AFM Cantilevers

We provide Silicon Cantilevers from Applied Nanostructures. These include standard cantilever for contact and non-contact modes, cantilever for MFM, EFM, Force Modulation mode as well as High Aspect Ratio cantilevers. These cantilevers are suitable for all commercial AFM systems. All cantilevers can be supplied with Aluminium backside coating for enhanced reflectivity. Other types of cantilevers are available upon request.

PDF Download

Cantilever brochure and price list (PDF, 3,4 MB)

Prices are subject to change without notice. Prices exclude VAT and delivery.
These prices are for use for non Pacific Nanotechnology AFMs ONLY. If needed for Pacific Nanotechnology AFMs, please contact LOT for a price quote.

NEW Hydra Cantilever - the only Hybrid contact/tapping mode in the market with a fully exposed silicon tip (PDF, 570 KB)

Quick Reference Chart of Probes

	Silicon Probes
	Silicon Nitride Probes

Options: A—Aluminum reflex coating, SS—Super Sharp Tip, TL—Tipless, G—Gold Reflex Coating, GG—Tip and Reflex side gold coating

Application	SPM Probe Model	Brief Description	Cantilever Length (µm)	Spring Constant (N/m)	Resonance Frequency (kHz)	Options
Non-Contact / Tapping Mode	APP-ACT	Silicon Tapping Mode Probe	125	40	300	A, SS, TL
	APP-ACL	Long Cantilever Tapping Mode Probe	225	45	190	A, SS, TL
	APP-FORT	Force Modulation Mode Probe	225	3	60	A, SS, TL
	APP-HYDRA6R-100N	Silicon Nitride Probe, Rectangular Cantilever	100	0,284	66	G, GG
	APP-HYDRA6V-100N	Silicon Nitride Probe, V-Shape, Narrow Cantilever	100	0,292	66	G, GG
	APP-HYDRA6V-100W	Silicon Nitride Probe, V- Shape, Wide Cantilever	100	0,405	67	G, GG
Contact Mode	APP-SICON	Silicon Contact Mode Probe	450	0,2	12	A, G, SS, TL
	APP-SHOCON	Short Cantilever Contact Mode Probe	225	0,1	28	A, G, SS, TL
	APP-HYDRA6R-200N	Silicon Nitride, Rectangular Cantilever	200	0,035	17	G, GG
	APP-HYDRA6V-200N	Silicon Nitride, V- Shape, Narrow Cantilever	200	0,045	17	G, GG
	APP-HYDRA6V-200W	Silicon Nitride, V-Shape, Wide Cantilever	200	0,081	17	G, GG
Force Curve	APP-HYDRA2R-100N	Nitride Probe, Rectangular Cantilever	100	0,011	21	G, GG
Force Curve	APP-HYDRA2R-50N	Nitride Probe, Rectangular Cantilever	50	0,084	77	G, GG
Electric Force Microscopy	APP-ANSCM-PA	High Spring Constant EFM Probe	125	40	300	N/A
	APP-ANSCM-PT	Medium Spring Constant EFM Probe	225	3	60	N/A
	APP-ANSCM-PC	Low Spring Constant EFM Probe	450	0,2	12	N/A
Magnetic Force Microscopy	APP-MAGT-LM	Low Moment MFM Probes	225	3	60	N/A
	APP-MAGT	Medium Moment MFM Probes	225	3	60	N/A
	APP-MAGT-HM	High Moment MFM Probes	225	3	60	N/A
	APP-MAGT-HR	High Resolution MFM Probes	225	3	67	N/A
High Aspect Ratio Depth Metrology	APP-HART0-1	No Tilt Compensation, 1 µm spike	125	40	300	A
	APP-HART0-2	No Tilt Compensation, 2 µm spike	125	40	300	A
	APP-HART0-4	No Tilt Compensation, 4 µm spike	125	40	300	A
	APP-HART3-1	3° Tilt Compensation, 1 µm spike	125	40	300	A
	APP-HART3-2	3° Tilt Compensation, 2 µm spike	125	40	300	A
	APP-HART3-4	3° Tilt Compensation, 4 µm spike	125	40	300	A
	APP-HART12-2	12° Tilt Compensation, 2 µm spike	125	40	300	A
	APP-HART12-4	12° Tilt Compensation, 4µm spike	125	40	300	A
	APP-HART12-6	12° Tilt Compensation, 6µm spike	125	40	300	A
Force Calibration	APP-FCL	5 Tipless Cantilevers per chip for spring constant calibration	50—450	0.12 — 77	14 —1000	A

↑ Back to Top ↑

International:

Search:



→ Alphabetical Search Index → Sitemap

→ Customer Feedback
→ Newsletter

Your contact:

Heath Young
Phone: 01372 378822
Fax: 01372 375353
heath@lotoriel.co.uk



		Ellipsometers Light Sources Multispectral imaging Nanoindentation Nanolithography Photovoltaics Thermal Imaging Semiconductors Solar Simulators SPM Squid Magnetometry Surface profilers VSM


	LOT-Oriel UK E-mail: info@lotoriel.co.uk				1 Mole Business Park Leatherhead, Surrey, KT22 7BA				Phone: 01372 378822 Fax: 01372 375353		emotiv design