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Integrating Spheres |
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Laser Publications |
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Products |
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LOT-Oriel - Products |
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Optical Filters. Lenses, Accessories |
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Optical Filters. Lenses, Accessories |
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Light Sources, Monochromators, Detectors |
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Light Sources, Monochromators, Detectors |
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Analytics and Spectroscopy, Microscopy |
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Analytics and Spectroscopy, Microscopy |
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Lasers, Laser Optics, Laser Accessories |
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Lasers, Laser Optics, Laser Accessories |
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Imaging, Thermal/High Speed/C-MOS, Metrology |
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Imaging, IR-/HighSpeed/C-MOS, Metrology |
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New Materials, Physical Properties, Magnetometry |
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New Materials, Physical Properties, Magnetometry |
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Surface Metrology, Thin Films, Biointerfaces |
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Surface Metrology, Thin Films, Biointerfaces |
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Nanotechnology, SPM, AFM |
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Nanotechnology, SPM, AFM |
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Optical Filters (UV - FIR) |
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Andover Optical Filters |
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Standard Bandpass Filters |
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Filtri a banda passante Standard - Specifications (200 - 299 nm) |
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Filtri a banda passante Standard - Specifications (300 - 399 nm) |
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Filtri a banda passante Standard - Specifications (400 - 499 nm) |
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Filtri a banda passante Standard - Specifications (500 - 599 nm) |
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Filtri a banda passante Standard - Specifications (600 - 699 nm) |
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Filtri a banda passante Standard - Specifications (700 - 799 nm) |
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Filtri a banda passante Standard - Specifications (800 - 899 nm) |
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Filtri a banda passante Standard - Specifications (900 - 999 nm) |
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Filtri a banda passante Standard - Specifications (1000 - 1555 nm) |
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Custom Bandpass Filters |
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Custom Bandpass Filters - Specifications (0.15 - 0.8 nm) |
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Custom Bandpass Filters - Specifications (1.0 nm) |
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Custom Bandpass Filters - Specifications (1.5 nm) |
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Custom Bandpass Filters - Specifications (2.0 nm) |
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Custom Bandpass Filters - Specifications (3.0 nm) |
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Custom Bandpass Filters - Specifications (5.0 nm) |
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Custom Bandpass Filters - Specifications (10 nm) |
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Custom Bandpass Filters - Specifications (20 nm) |
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Custom Bandpass Filters - Specifications (40 - 80 nm) |
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Image Quality Filters |
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Standard Bandpass Filter Sets |
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User-Defined Filter Sets |
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Temperature Controllers |
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Standard Bandpass Filter Sets - Specifications Ultraviolet |
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Standard Bandpass Filter Sets - Specifications Visible |
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Standard Bandpass Filter Sets - Specifications Near Infrared |
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Standard Bandpass Filter Sets - Specifications Mercury |
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Standard Bandpass Filter Sets - Specifications Zinc and Cadmium |
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Neutral Density Filters - Metallic Type |
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Neutral Density Filters - Metallic Type - Specifications VIS-NIR |
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Neutral Density Filters - Metallic Type - Specifications UV-VIS-NIR |
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Absorptive Neutral Density Filters |
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Neutral Density Filter Sets |
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Heat Control Filters |
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Specifications Specci freddi |
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Specifications Hot Mirrors |
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Specifications UV Cold Mirrors |
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Specifications IR Suppression Filters |
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Dichroic Filters |
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Specifications Color Additive Filters |
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Specifications Color Subtractive Filters |
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Specifications Reflective Filters |
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Dichroic Filter Sets |
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Edge Filters (Long Wave/Short Wave Pass) |
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Specifications VIS Long Wave Pass |
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Specifications VIS Short Wave Pass |
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Specifications NIR Long Wave Pass |
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Specifications NIR Short Wave Pass |
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Edge Filter Sets |
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Spectrophotometric Standards |
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Filter Glass |
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Specifications Bandpass Filter Glass |
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Specifications Long Pass Filter Glass |
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Anti-Reflection Coatings |
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Beam Splitters |
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Filters for Analyzing Fluorescence |
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Filters for Analyzing Fluorescence |
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Electrical Tunable Filters |
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Electrically Tunable Filters - VariSpec |
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Quartz and Glass Lenses |
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Quartz and Glass Lenses |
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Spatial Light Modulator (SLM) |
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Spatial Light Modulator (SLM) |
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Light Sources for Research, Development and Industry |
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Light Sources for Research, Development and Industry |
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Monochromators and Spectrographs |
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Monochromators and Spectrographs |
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Spectrographs |
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Monochromators |
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CCD/ICCD/EMCCD Detectors |
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CCD/ICCD/EMCCD Detectors |
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CCD Detectors and InGaAs Photodiode Arrays |
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UV and X-Ray CCD Detectors |
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EMCCD Detectors |
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EMCCD Interactive Tutorial |
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ICCD Detectors |
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ICCD Quantum Efficiencies in a Flash Animation |
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CCD Line Detectors |
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Spectrographs |
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Quantum Register with Neutral Caesium Atoms |
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About Andor |
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Seminar CCD-, ICCD- und EMCCD-Detektoren |
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Integrating Spheres |
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Integrating Spheres |
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FT-IR Spectroscopy Accessories |
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FT-IR Spectroscopy Accessories |
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Standards and Targets |
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Standards and Targets |
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Hollow Cathode Lamps |
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Hollow Cathode Lamps |
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Deuterium Lamps |
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Deuterium Lamps |
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PID Lamps/Line Sources |
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PID Lamps/Line Sources |
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Disc Centrifuge |
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Disc Centrifuge |
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Spin Coater/Dip Coater |
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Spin Coater/Dip Coater |
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Microscope Cameras |
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Microscope Cameras |
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Laser powermeter |
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Laser Powermeter |
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Diamond Optics |
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Diamond Optics |
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Accessories for Microscopy |
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Accessories for Microscopy |
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Nuance |
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Nuance |
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Maestro In-Vivo Imaging System |
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Maestro - In-Vivo Imaging System |
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Nd:YAG-Lasers |
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Nd:YAG-Lasers |
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Surface Profilers |
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Profilers |
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Nano- and Micro Hardness Tester |
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Nano- and Micro Hardness Tester |
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ESCA System SAGE |
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ESCA System SAGE |
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SAGE HR |
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Laser Diagnostics |
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Laser Diagnostics - Wavefront Sensor |
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Propagationsanalyse von Laserstrahlung mit dem Wellenfrontsensor |
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Infrared Camera Systems |
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Infrared Camera Systems |
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IR Lenses |
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IR Lenses |
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Pulsed Thermography |
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Thermal Wave Imaging |
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ThermoScope II |
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Press Release - Shuttle Inspection |
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High Speed Cameras |
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Highspeed Cameras |
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Kerr Magnetometer |
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Kerr Magnetometer NanoMOKE |
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QCM-D Quartz Crystal Microbalance |
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Quartz Crystal Microbalance |
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Q-Sense E4 |
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Measurement Chamber Platform QCP 401 |
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Electronics Unit QE 401 |
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Q-Sense E1 |
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Software QSoft 401 and QTools 2.0 |
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Sensor Crystals |
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Immobilization protocols |
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CMOS Cameras for scientific and industrial applications |
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CMOS Cameras for scientific and industrial applications |
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PicoPlus |
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PicoPlus |
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PNI - Nanotechnology Solutions |
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Pacific Nanotechnology Inc. - Nanotechnology, Nano-R, Nano-I |
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Fiber Optics |
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Fiber Optics |
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Nanospectralyzer |
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Nanospectralyzer |
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UVX Radiometer |
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UV Radiometer |
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Reflecting Microscope Objectives |
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Reflecting Microscope Objectives |
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fluoroSENS Fluorimeter |
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fluoroSENS Fluorimeter |
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Hyperspectral Imaging |
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Hyperspectral Imaging |
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Abrio Imaging System |
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Abrio/LC-PolScope |
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Surface Plasmon Spectroscopy (SPS) |
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Surface Plasmon Spectroscopy (SPS) |
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Vibrating Sample Magnetometer |
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Vibrating Sample Magnetometer (VSM) |
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VSM - Properties and Options |
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VSM - Applications and Models |
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VSM - Model Overview |
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Disk and Wafer Mapping Systems |
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Mapper Systems |
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Mapper Systems -Properties and Options |
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Mapper Systems - Applications and Systems |
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MPMS-XL (Magnetic Property Measurement) |
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MPMS-XL (Magnetic Property Measurement) |
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PPMS |
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PPMS Physical Property Measurement System |
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16 Tesla PPMS |
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P525 Vibrating Sample Magnetometer |
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Model P850 - PPMS Dilution Refrigerator System (DR) |
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High Temperature Superconducting Magnets, Current Leads and Components |
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HTS-magnets, current leads and components |
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Pressure Cell Modules for electrical and magnetical measurement |
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High–Pressure Cell Modules for electrical and magnetical measurement |
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SQUID Measurement Systems |
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SQUID Measurement Systems |
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Cantilevers & AFM Calibration Standards |
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Cantilevers & AFM Calibration Standards |
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Spectroscopic Ellipsometers |
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Spectroscopic Ellipsometers |
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VASE |
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VUV-VASE |
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IR-VASE |
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M-2000 |
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MASE |
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Alpha-SE |
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Spectroscopic Ellipsometers Software |
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Spectroscopic Ellipsometers Application Notes |
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Nano-Ink NScriptor |
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Nano-Ink NScriptor |
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Single Channel Detectors |
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Single Channel Detectors |
Contacts |
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Contacts |
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Contacts |
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Thomas Beppler |
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Andreas Bergner |
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Olivier Dubreuil |
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Hassan Farshchi |
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Michael Fichtner |
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Jürgen Fischbach |
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Michael Foos |
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Michael Foos |
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Wilfried Helle |
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Rainer Hess |
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Gerhard Jockwich |
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Ralph Köhler |
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Olaf Koschützke |
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Marc Kunzmann |
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Marc Kunzmann |
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Patrick Lindemann |
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Monica Martinez |
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Jochen Mentges |
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Thorsten Pieper |
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Stefan Riesner |
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Raimund Sauter |
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Jürgen Schlütter |
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Alexander Schrenk |
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Ralf Siegel |
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Karlheinz Szemeritsch |
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Jörg Tobisch |
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Natalia Tristan |
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Thomas Wagner |
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Joachim Weiss |
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Rainer Weißflog |
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Stefan Wittmer |
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Yuri Zheleznov |
Events |
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Events |
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LOT-Oriel - Events |
Spectrum |
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Spectrum |
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LOT-Oriel - Spectrum |
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European Edition 7 |
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European Edition 7 |
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Applied Nanostructures - AFM cantilevers |
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The Nano-DST™ - high-speed AFM with atomic resolution |
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The new Nano-E™ AFM system for standard research and education |
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Ellipsometry-Workshop 2008 |
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Photovoltaic applications of spectroscopic ellipsometry |
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Ellipsometry workshop, July 2nd 2008 in Spain |
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NewView 7000 series - advanced, high performance 3D optical profilers |
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High end Cheetah aims at high speed SWIR imaging |
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Everything you want to know about light sources |
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Magnetometry & More |
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Nano impact testing of surfaces |
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Informal seminar on measurements of mechanical properties |
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New Andover filter catalog |
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Visit the VLOC Waveplate Store |
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Disc centrifuge for high resolution particle size measurement |
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Thin film characterization by Surface Plasmon Resonance (SPR) |
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Studying cell interactions using the Q-Sense window module |
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European Edition 6 |
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Table of Contents |
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Nano-DST |
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AFM cantilevers |
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Nano-Rp capabilities in particles characterization |
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BioMat workstation - imaging opaque samples |
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Training course on Ellipsometry data analysis |
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Ellipsometry workshop 2008 in Spain |
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New camera developments in NIR and IR imaging |
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Citius high speed cameras |
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Monochromatic light sources |
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The iHelium-3 magnetometer |
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PPMS - The Swiss knife for your physical laboratory |
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IR floating zone furnace from Canon Machinery |
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High temperature nanoindentation |
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High throughput filters for fluorescence spectroscopy |
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Ultra steep short pass filters |
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New InGaAs detectors for NIR spectroscopy |
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QCM-D E4: Tracking changes at the surface |
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European Edition 5 |
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European Edition 5 |
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In-situ spectroscopic ellipsometry for ALD |
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Ellipsometry workshop 2007 |
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NIR cameras for the extended infrared |
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Centurio – a high-speed camera with a medium frame rate |
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Zygo’s aspheric interferometer |
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The next generation of solar simulators |
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UV-VIS mercury fiber optic illuminator |
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Light sources for research, development and industry |
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Quantum Design’s cryogen-free VSM – the VersaLab |
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Opti-MAxes – vector magneto-optic system from AMI |
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CellHesion module for the JPK BioAFM |
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HYDRA – a new generation of cantilevers |
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Nanocrystalline hydroxyapatite surfaces for biomaterial research |
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Ealing Catalog Inc. and LOT-Oriel – a strategic partnership |
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Diamond windows finally made affordable |
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New Andover filter catalog |
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CPS disc centrifuges – particle size measurement |
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Gilden Photonics monochromators and spectrographs |
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