PRODUCTS:
 Optical Filters, Lenses, A...
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 Analytics and Spectroscopy...
 Lasers, Laseroptics, Laser...
 IR cameras, Metrology
 New Materials Properties, ...
 Surface Metrology, Thin Fi...
 Nanotechnology, SPM, AFM

Nanotechnology, SPM, AFM
PicoPlus – High End AFM applying MAC-Mode™, environmental control, in particular suitable for biological samples, Force Spectroscopy and Electro Chemistry Nanoink NScriptor™ DPNWriter™ – Dip Pen Nanolithographie™ (DPN™)
Nano-R2 and Nano-I2 – Routine AFM, excellent performance and quality at affordable price, for Imaging and Metrology Nanoindentation – Mechanical Properties of thin films
Cantilevers & AFM Calibration Standards Nanospectralyzer™ for Single-walled Carbon Nanotube (SWNT) Characterisation



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Quantum Design:
→ www.QDUSA.com

 News:
→ Large Area Imaging at -100 °C ....the Andor iKon-M (PDF, 246 KB)
→ Merger between LOT-Oriel Europe and Quantum Design (PDF, 56 KB)
→ Near Infrared Beam Profiler
→ New Ultra High Speed Camera Cheetah

AcademLOT
E-mail: academ@lot-oriel.com

ul. Butlerova 15
117342 Moscow, Russia

Phone: 495-938-1866
Fax: 495-938-1907


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