PRODUCTS:
 Optical Filters, Lenses, A...
 Light Sources, Monochromat...
 Analytics and Spectroscopy...
 Lasers, Laseroptics, Laser...
 IR cameras, Metrology
 New Materials Properties, ...
 Surface Metrology, Thin Fi...
 Nanotechnology, SPM, AFM

Imaging, IR-/HighSpeed/C-MOS, Metrology
Infrared Camera Systems High Speed Cameras
IR Lenses Particle Size Analyzer (Disc Centrifuge)
C-MOS Cameras Nuance – Multi Spectral Imaging System
Pulse Thermography, Nondestructive Testing Maestro in-vivo Imaging System
Optical Profiler, Stress Analysis Abrio™/LC-PolScope™
CCD, ICCD and EMCCD Detectors for High-End Imaging Hyperspectral Imaging



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 Links:
Quantum Design:
→ www.QDUSA.com

 News:
→ Large Area Imaging at -100 °C ....the Andor iKon-M (PDF, 246 KB)
→ Merger between LOT-Oriel Europe and Quantum Design (PDF, 56 KB)
→ Near Infrared Beam Profiler
→ New Ultra High Speed Camera Cheetah

AcademLOT
E-mail: academ@lot-oriel.com

ul. Butlerova 15
117342 Moscow, Russia

Phone: 495-938-1866
Fax: 495-938-1907


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