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Lasers, Optics, Technology |
Produse |
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Products |
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Produse |
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Metrologie de suprafata, Filme subtiri, Bio-interfete |
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Metrologie de suprafata, Filme subtiri, Bio-interfete |
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Nanotehnologie, SPM, AFM |
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Nanotehnologie, SPM, AFM |
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Testarea nano-si micro-duritatii |
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Testarea nano-si micro-duritatii |
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Application oriented seminar |
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Elipsometrie spectroscopica |
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Spectroscopic Ellipsometers |
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VASE |
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VUV-VASE |
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IR-VASE |
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M-2000 |
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MASE |
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Alpha-SE |
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Spectroscopic Ellipsometers Software |
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Spectroscopic Ellipsometers Application Notes |
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Woollam-Ellipsometrie-Seminar |
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QCM-D Quartz Crystal Microbalance |
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Quartz Crystal Microbalance |
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Q-Sense E4 |
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Measurement Chamber Platform QCP 401 |
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Electronics Unit QE 401 |
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Q-Sense E1 |
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Q-Sense D300 |
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Software QSoft 401 and QTools 2.0 |
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Sensor Crystals |
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Immobilization protocols |
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Nano-Ink NScriptor |
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Nano-Ink NScriptor |
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PNI - Nanotechnology Solutions |
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Pacific Nanotechnology Inc. - Nanotechnology, Nano-R, Nano-I |
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Disc Centrifuge |
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Disc Centrifuge |
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Surface Plasmon Spectroscopy (SPS) |
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Surface Plasmon Spectroscopy (SPS) |
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Filtre optice, Lentile, Accesorii |
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Filtre optice, Lentile, Accesorii |
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Surse de lumina, Monocromatoare, Detectoare |
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Surse de lumina, Monocromatoare, Detectoare |
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Tehnici de Vizualizare, Vizualizare hyperspectrala, Metrologie IR/Viteza ridicata/CMOS |
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Tehnici de Vizualizare, Vizualizare hyperspectrala, Metrologie IR/Viteza ridicata/CMOS |
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Masuratori analitice si spectroscopie, Microscopie |
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Masuratori analitice si spectroscopie, Microscopie |
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Laseri, Optica pentru laseri, Accesorii pentru laseri |
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Laseri, Optica pentru laseri, Accesorii pentru laseri |
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Materiale noi, Proprietati fizice, Magnetometrie |
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Materiale noi, Proprietati fizice, Magnetometrie |
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Filtre optice (VUV- FIR) |
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Andover Optical Filters |
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Standard Bandpass Filters |
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Filtri a banda passante Standard - Specifications (200 - 299 nm) |
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Filtri a banda passante Standard - Specifications (300 - 399 nm) |
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Filtri a banda passante Standard - Specifications (400 - 499 nm) |
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Filtri a banda passante Standard - Specifications (500 - 599 nm) |
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Filtri a banda passante Standard - Specifications (600 - 699 nm) |
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Filtri a banda passante Standard - Specifications (700 - 799 nm) |
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Filtri a banda passante Standard - Specifications (800 - 899 nm) |
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Filtri a banda passante Standard - Specifications (900 - 999 nm) |
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Filtri a banda passante Standard - Specifications (1000 - 1555 nm) |
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Custom Bandpass Filters |
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Custom Bandpass Filters - Specifications (0.15 - 0.8 nm) |
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Custom Bandpass Filters - Specifications (1.0 nm) |
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Custom Bandpass Filters - Specifications (1.5 nm) |
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Custom Bandpass Filters - Specifications (2.0 nm) |
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Custom Bandpass Filters - Specifications (3.0 nm) |
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Custom Bandpass Filters - Specifications (5.0 nm) |
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Custom Bandpass Filters - Specifications (10 nm) |
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Custom Bandpass Filters - Specifications (20 nm) |
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Custom Bandpass Filters - Specifications (40 - 80 nm) |
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Image Quality Filters |
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Standard Bandpass Filter Sets |
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User-Defined Filter Sets |
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Temperature Controllers |
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Standard Bandpass Filter Sets - Specifications Ultraviolet |
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Standard Bandpass Filter Sets - Specifications Visible |
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Standard Bandpass Filter Sets - Specifications Near Infrared |
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Standard Bandpass Filter Sets - Specifications Mercury |
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Standard Bandpass Filter Sets - Specifications Zinc and Cadmium |
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Neutral Density Filters - Metallic Type |
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Neutral Density Filters - Metallic Type - Specifications VIS-NIR |
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Neutral Density Filters - Metallic Type - Specifications UV-VIS-NIR |
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Absorptive Neutral Density Filters |
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Neutral Density Filter Sets |
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Heat Control Filters |
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Specifications Specci freddi |
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Specifications Hot Mirrors |
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Specifications UV Cold Mirrors |
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Specifications IR Suppression Filters |
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Dichroic Filters |
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Specifications Color Additive Filters |
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Specifications Color Subtractive Filters |
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Specifications Reflective Filters |
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Dichroic Filter Sets |
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Edge Filters (Long Wave/Short Wave Pass) |
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Specifications VIS Long Wave Pass |
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Specifications VIS Short Wave Pass |
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Specifications NIR Long Wave Pass |
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Specifications NIR Short Wave Pass |
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Edge Filter Sets |
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Spectrophotometric Standards |
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Filter Glass |
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Specifications Bandpass Filter Glass |
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Specifications Long Pass Filter Glass |
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Anti-Reflection Coatings |
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Beam Splitters |
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Electrical Tunable Filters |
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Electrically Tunable Filters - VariSpec |
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Filters for Analyzing Fluorescence |
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Filters for Analyzing Fluorescence |
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Quartz and Glass Lenses |
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Quartz and Glass Lenses |
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Spatial Light Modulator (SLM) |
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Spatial Light Modulator (SLM) |
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Optomechanical Components from Ealing Catalog Inc. |
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Reflecting Microscope Objectives |
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Light Sources for Research, Development and Industry |
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Light Sources for Research, Development and Industry |
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Monochromators and Spectrographs |
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Monochromators and Spectrographs |
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Single Channel Detectors |
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Single Channel Detectors |
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Integrating Spheres |
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Integrating Spheres |
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Fiber Optics |
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Fiber Optics |
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FT-IR Spectroscopy Accessories |
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FT-IR Spectroscopy Accessories |
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Standards and Targets |
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Standards and Targets |
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Hollow Cathode Lamps |
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Hollow Cathode Lamps |
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Deuterium Lamps |
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Deuterium Lamps |
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PID Lamps/Line Sources |
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PID Lamps/Line Sources |
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Spin Coater/Dip Coater |
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Spin Coater/Dip Coater |
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Nuance |
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Nuance |
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Diamond Optics |
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Diamond Optics |
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Laser powermeter |
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Laser Powermeter |
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Laser Diagnostics |
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Laser Diagnostics - Wavefront Sensor |
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Propagationsanalyse von Laserstrahlung mit dem Wellenfrontsensor |
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Infrared Camera Systems |
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Infrared Camera Systems |
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Pulsed Thermography |
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Thermal Wave Imaging |
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ThermoScope II |
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Press Release - Shuttle Inspection |
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Surface Profilers |
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Profilers |
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High Speed Cameras |
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Highspeed Cameras |
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Kerr Magnetometer |
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Kerr Magnetometer NanoMOKE |
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Vibrating Sample Magnetometer |
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Vibrating Sample Magnetometer (VSM) |
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VSM - Applications and Models |
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VSM - Model Overview |
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Disk and Wafer Mapping Systems |
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Mapper Systems |
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Mapper Systems -Properties and Options |
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Mapper Systems - Applications and Systems |
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MPMS-XL (Magnetic Property Measurement) |
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MPMS-XL (Magnetic Property Measurement) |
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PPMS |
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PPMS Physical Property Measurement System |
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16 Tesla PPMS |
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P525 Vibrating Sample Magnetometer |
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Model P850 - PPMS Dilution Refrigerator System (DR) |
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SQUID Measurement Systems |
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SQUID Measurement Systems |
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Cantilevers & AFM Calibration Standards |
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Cantilevers & AFM Calibration Standards |
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ESCA System SAGE |
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ESCA System SAGE |
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SAGE HR |
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Surface Chemistry |
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Surface Chemistry |
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KSV 5000 Langmuir Blodgett System |
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KSV 3000 Langmuir Blodgett System |
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KSV 2000 Langmuir Blodgett System |
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KSV Minitrough |
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Special Troughs |
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Review Articles and Publications |
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International KSV Distributors |
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Brewster Angle Microscope |
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Brewster Angle Microscope |
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IR Lenses |
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IR Lenses |
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Maestro In-Vivo Imaging System |
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Maestro - In-Vivo Imaging System |
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Pressure Cell Modules for electrical and magnetical measurement |
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High–Pressure Cell Modules for electrical and magnetical measurement |
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High Temperature Superconducting Magnets, Current Leads and Components |
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HTS-magnets, current leads and components |
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CMOS Cameras for scientific and industrial applications |
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CMOS Cameras for scientific and industrial applications |
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Abrio Imaging System |
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Abrio/LC-PolScope |
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IR Floating Zone Furnace |
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IR Floating Zone Furnace |
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Nanospectralyzer |
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Nanospectralyzer |
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Intas Gel-Imager |
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Intas Gel-Imager |
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AMI Superconducting Magnet Systems |
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AMI Superconducting Magnet Systems |
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PSM – Potential-Seebeck Microprobe |
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PSM – Potential-Seebeck Microprobe |
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MPMS SQUID VSM |
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MPMS SQUID VSM |
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fluoroSENS Fluorimeter |
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fluoroSENS Fluorimeter |
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VersaLab - 3 Tesla Cryogen-free VSM |
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VersaLab - 3 Tesla Cryogen-free VSM |
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Nano-DST |
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Nano-DST |
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Hyperspectral Imaging |
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Hyperspectral Imaging |
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FEI Phenom |
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FEI Phenom |
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Cryo*Con |
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Cryo*Con |
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Nanowizard |
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Nanowizard |
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CT Systems for the µm and nm range |
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CT Systems for the µm and nm range |
Contacte |
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Contacts |
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Contacts |
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Thomas Beppler |
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Andreas Bergner |
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Octavian Buiu |
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Olivier Dubreuil |
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Hassan Farshchi |
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Michael Fichtner |
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Jürgen Fischbach |
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Michael Foos |
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Michael Foos |
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Wilfried Helle |
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Rainer Hess |
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Roxana Ivan |
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Gerhard Jockwich |
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Ralph Köhler |
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Olaf Koschützke |
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Marc Kunzmann |
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Marc Kunzmann |
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Patrick Lindemann |
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Monica Martinez |
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Jochen Mentges |
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Thorsten Pieper |
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Stefan Riesner |
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Raimund Sauter |
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Jürgen Schlütter |
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Alexander Schrenk |
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Ralf Siegel |
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Karlheinz Szemeritsch |
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Jörg Tobisch |
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Natalia Tristan |
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Thomas Wagner |
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Joachim Weiss |
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Rainer Weißflog |
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Stefan Wittmer |
Evenimente |
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Events |
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LOT-Oriel - Events |
Spectrum |
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Spectrum |
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LOT-Oriel - Spectrum |
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European Edition 8 |
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HYDRA cantilevers for BioAFM |
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High-resolution imaging with the Bio-AFM system NanoWizard II |
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Photovoltaic in ellipsometry |
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Non-invasive 3D imaging of biological to advanced materials in high resolution |
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Extended coverage of XEVA and XS cameras from SWIR into the visible |
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Low cost CCD cameras with EM (electron multiplication) technology |
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Everything you want to know about light sources |
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The Cryogenic Control Systems – state-of-the-art electronic equipment |
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VersaLab VSM magnetometer – a new workhorse for magnetic material characterization |
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Optical filters UV – FIR |
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Multispectral imaging – quick and easy |
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New light source – the CPS disc centrifuge is now even more sensitive |
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Solar cell IV-curve characterization – virtually any application possible |
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Single wall carbon nanotubes: a new trend in biotechnology? |
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CCD line array cameras at good value for money |
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The RT-08 SPR spectrometer has arrived |
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European Edition 7 |
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European Edition 7 |
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Applied Nanostructures - AFM cantilevers |
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The Nano-DST™ - high-speed AFM with atomic resolution |
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The new Nano-E™ AFM system for standard research and education |
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Ellipsometry-Workshop 2008 |
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Photovoltaic applications of spectroscopic ellipsometry |
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Ellipsometry workshop, July 2nd 2008 in Spain |
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NewView 7000 series - advanced, high performance 3D optical profilers |
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High end Cheetah aims at high speed SWIR imaging |
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Everything you want to know about light sources |
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Magnetometry & More |
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Nano impact testing of surfaces |
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Informal seminar on measurements of mechanical properties |
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New Andover filter catalog |
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Visit the VLOC Waveplate Store |
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Disc centrifuge for high resolution particle size measurement |
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Thin film characterization by Surface Plasmon Resonance (SPR) |
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Studying cell interactions using the Q-Sense window module |
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European Edition 6 |
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Table of Contents |
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Nano-DST |
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AFM cantilevers |
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Nano-Rp capabilities in particles characterization |
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BioMat workstation - imaging opaque samples |
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Training course on Ellipsometry data analysis |
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New camera developments in NIR and IR imaging |
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Citius high speed cameras |
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Monochromatic light sources |
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The iHelium-3 magnetometer |
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PPMS - The Swiss knife for your physical laboratory |
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