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Spectrum - European Edition 7 (June 2008)
Table of Contents:
AFM – Applied Nanostructures - AFM cantilevers
AFM – The Nano-DST™ - high-speed AFM with atomic resolution
AFM – The new Nano-E™ AFM system for standard research and education
Ellipsometry – Ellipsometry-Workshop 2008
Ellipsometry – Photovoltaic applications of spectroscopic ellipsometry
Ellipsometry – Ellipsometry workshop, July 2nd 2008 in Spain - a one-day introduction
Imaging – High end Cheetah aims at high speed SWIR imaging
Interferometry – NewView 7000 series - advanced, high performance 3D optical profilers
Light sources – Everything you want to know about light sources
Magnetometry – PPMS - Magnetometry & More
Material properties – Nano impact testing of surfaces
Material properties – Informal seminar on measurements of mechanical properties
Optics – New Andover filter catalog
Optics – Visit the VLOC “Waveplate Store” – now online!
Particle size – Disc centrifuge for high resolution particle size measurement
Thin films – Thin film characterization by Surface Plasmon Resonance (SPR)
Thin films – From below and above - studying cell interactions using the Q-Sense window module


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