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SPECTRUM:

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European Edition 6

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Spectrum - European Edition 6 (November 2007)

Table of Contents:

AFM – Nano-DST™: the new high performance Atomic Force Microscope

AFM – cantilevers for all kind of applications

AFM – Nano-Rp™ capabilities in particles characterization

AFM – BioMat™ workstation – perfect results in imaging opaque samples

Ellipsometry – Training course on Ellipsometry data analysis

Ellipsometry – Ellipsometry workshop 2008 in Spain – a one day introduction

Imaging – New camera developments in NIR and IR imaging

Imaging – Citius high speed cameras in paper mills

Light Sources – Monochromatic light sources: Universal workhorses for the optics laboratory

Magnetometry – The iHelium-3 magnetometer

Magnetometry – PPMS: he Swiss knife for your physical laboratory

Material Properties – IR floating zone furnace from Canon Machinery

Material Properties – High temperature nanoindentation – now in the LOT application lab

Optical Filters – High throughput filters for fluorescence spectroscopy

Optical Filters – Ultra steep short pass filters

Spectroscopy – All new InGaAs detectors for NIR spectroscopy

Thin Films – QCM-D E4: Tracking changes at the surface

International:

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	LOT-Oriel Polska E-mail: dluzewski@lot-oriel.com				Szyb Walenty 32 41-700 RUDA SLASKA, POLEN				Phone/Fax: 48 322482048		emotiv design