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Spectrum - European Edition 4 (December 2006)

Table of Contents:
AFM – Nano Wizard II – the next generation in BioAFM from JPK
AFM – PNI presents: Second generation routine AFM systems
AFM – Sharp AFM cantilevers
Cryotechnology – Liquid helium level instruments for science and industry
Cryotechnology – Cold crystals – CRYOCOOL-LHE
Ellipsometry – New heat cell for ellipsometers
Ellipsometry – Integrating spectroscopic ellipsometry into industrial applications
Imaging – Xenics IR and NIR cameras
Imaging – Maximum image quality at ultra fast speeds
Imaging – Low light imaging – the Andor iXonEM+
Interferometry – Enhance your optical surface form measurements
Lasers – Hartmann Shack – beam diagnosis
Light Sources – Compact 150W Xe light source
Light Sources – The new light sources catalog
Light Sources – LOT-Oriel and LEJ – a strategic partnership
Material properties – Quantum Design's new SQUID-based VSM
Material properties – High-temperature nanoindentation on PET samples
Nanotechnology – 55.000-pen two dimensional array – the next step in Dip-Pen Nanolithography (DPN®)
Nanotechnology – Manipulating the nanoworld – Microgripper
Nanotechnology – Carbon nanotube characterization
Optical Filters – Optical Filters VUV – FIR
Optical Filters – Highest performance raman edge, notch and laser line filters
Surfaces – P-16 – KLA-Tencor's new surface profiler
Surfaces – Spin Coater: Tools for preparing ultrathin films for spectroscopic applications


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 Nowości:
Large Area Imaging at -100 °C ....the Andor iKon-M (PDF, 246 KB)
Merger between LOT-Oriel Europe and Quantum Design (PDF, 56 KB)
Near Infrared Beam Profiler
New Ultra High Speed Camera Cheetah

LOT-Oriel Polska
E-mail: dluzewski@lot-oriel.com

Szyb Walenty 32
41-700 RUDA SLASKA, POLEN

Phone/Fax: 48 322482048


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