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Witamy w LOT-Oriel |
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Witamy w LOT-Oriel - Lasers, Optics, Technology |
Oferta |
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Integrating Spheres |
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Integrating Spheres |
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Laser Publications |
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Laser Publications |
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Products |
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LOT-Oriel - Products |
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Filtry Optyczne, Soczewki, Akcesoria |
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Filtry Optyczne, Soczewki, Akcesoria |
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Źródła Światła, Monochromatory, Detektory |
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Źródła Światła, Monochromatory, Detektory |
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Analityka i Spektroskopia, Mikroskopia |
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Analityka i Spektroskopia, Mikroskopia |
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Lasery, optyka laserowa, akcesoria do laserów |
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Lasery, optyka laserowa, akcesoria do laserów |
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Obrazowanie, szybkie IR, metrologia |
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Obrazowanie, szybkie IR, metrologia |
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Nowe materiały, Właściwości fizyczne, Magnetometry |
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Nowe materiały, własności fizyczne, magnetometry |
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Metrologia powierzchniowa, cienkie warstwy, biointerfejsy |
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Metrologia powierzchniowa, cienkie warstwy, biointerfejsy |
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Nanotechnologia, SPM, AFM |
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Nanotechnology, SPM, AFM |
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Filtry Optyczne (VUV- FIR) |
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Filtry Optyczne (VUV- FIR) |
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Filtry do analizy fluorescencji |
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Filtry do analizy fluorescencji |
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Filtry przestrajane elektrycznie |
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Filtry przestrajane elektrycznie |
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Soczewki kwarcowe i szklane |
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Soczewki kwarcowe i szklane |
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Przestrzenny modulator światła (SLM) |
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Przestrzenny modulator świetlny (SLM) |
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Źródła światła dla prac badawczych, rozwojowych i przemysłu |
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Źródła światła dla prac badawczych, rozwojowych i przemysłu |
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Monochromatory i spektografy |
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Monochromatory i spektografy |
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Spectrographs |
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Monochromators |
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Detektory CDD/ICCD/EMCCD, Fotodiodi |
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Detektory CDD/ICCD/EMCCD |
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CCD Detectors and InGaAs Photodiode Arrays |
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UV and X-Ray CCD Detectors |
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EMCCD Detectors |
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EMCCD Interactive Tutorial |
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ICCD Detectors |
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ICCD Quantum Efficiencies in a Flash Animation |
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CCD Line Detectors |
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Spectrographs |
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Quantum Register with Neutral Caesium Atoms |
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About Andor |
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Wzorce odblaskowe i tarcze |
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Wzorce odblaskowe i tarcze |
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Kolorowa kamera wideo dla mikroskopii |
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Kolorowa kamera wideo dla mikroskopii |
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Nuance – System obrazowania multispektralnego |
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Nuance – System obrazowania multispektralnego |
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Mikromanipulator i akcesoria dla mikroskopii |
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Mikromanipulator i akcesoria dla mikroskopii |
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Czujnik czoła fali |
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Czujnik czoła fali |
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Systemy kamer na podczerwień |
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Systemy kamer na podczerwień dla wszystkich długości fal |
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Objektywy IR |
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Objektywy IR |
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Profilometry |
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Profilometry |
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Szybkie kamery |
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Szybkie kamery |
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Magnetometr Kerra NanoMOKE2 |
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Magnetometr Kerra |
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Magnetometr wibrującej próbki (VSM) |
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Magnetometr wibrującej próbki (VSM) |
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VSM - Properties and Options |
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VSM - Applications and Models |
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VSM - Model Overview |
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Systemy mapowania (MOKE) |
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Systemy mapowania (MOKE) |
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Mapper Systems -Properties and Options |
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Mapper Systems - Applications and Systems |
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HTS – magnesy, doprowadzenia prądowe i komponenty |
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HTS – magnesy, doprowadzenia prądowe i komponenty |
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Cantilevers & AFM Calibration Standards |
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Cantilevers & AFM Calibration Standards |
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System mierzenia nano- i mikrotwardości |
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System mierzenia nano- i mikrotwardości |
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Workshop |
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Elipsometry spektroskopowe |
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Elipsometry spektroskopowe |
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VASE |
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VUV-VASE |
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IR-VASE |
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M-2000 |
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MASE |
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Alpha-SE |
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Spectroscopic Ellipsometers Software |
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Spectroscopic Ellipsometers Application Notes |
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Woollam Ellipsometry Seminar |
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Nano-Ink NScriptor |
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Nano-Ink NScriptor™ DPNWriter™ |
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Bias Control Option for NScriptor™ |
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Single Channel Detectors |
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Single Channel Detectors |
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Akcesoria do spektroskopów FT- IR |
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Akcesoria do spektroskopów FT-IR |
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Lampy deuterowe |
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Lampy deuterowe |
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Lampy z wydrążoną katodą |
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Lampy z wydrążoną katodą |
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Lampy PID/Źródła liniowe |
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Lampy PID/Źródła liniowe |
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Maestro - System obrazowania in-vivo |
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Maestro - System obrazowania in-vivo |
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Powlekacz obrotowy |
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Powlekacz obrotowy |
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Termografia impulsowa , nieniszczące testowanie |
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Termografia impulsowa, nieniszczące testowanie |
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ThermoScope II |
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Press Release - Shuttle Inspection |
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Moduł komórki ciśnieniowej do pomiarów elektrycznych i magnetycznych |
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Moduł komórki ciśnieniowej do pomiarów elektrycznych i magnetycznych |
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MPMS (Miernik własności magnetycznych) |
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MPMS XL (Miernik Własności Magnetycznych) |
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MPMS Evercool |
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PPMS (Miernik własności fizycznych) |
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PPMS (Miernik własności fizycznych) |
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16 Tesla PPMS |
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P525 Vibrating Sample Magnetometer |
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Model P850 - PPMS Dilution Refrigerator System (DR) |
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Układy pomiarowe ze SQUIDem (niska/ wysoka temperatura) |
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Układy pomiarowe ze SQUIDem (niska/ wysoka temperatura) |
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Mikrowaga z kryształu kwarcu z kontrolą rozpraszania (dyssypacji) |
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Mikrowaga z kryształu kwarcu z kontrolą rozpraszania (dyssypacji) |
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Q-Sense E4 |
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Measurement Chamber Platform QCP 401 |
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Electronics Unit QE 401 |
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Q-Sense D300 |
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Measurement chamber QAFC 302 |
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Electronics unit QE 301 |
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Software QSoft 401 and QTools 2.0 |
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Sensor Crystals |
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Immobilization protocols |
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Nd:YAG-Lasers |
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Nd:YAG-Lasers |
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PNI - Nanotechnology Solutions |
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Pacific Nanotechnology Inc. - Nanotechnology, Nano-R, Nano-I |
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Fiber Optics |
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Fiber Optics |
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Radiometr UV |
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Radiometr UV |
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System analizy rozmiarów czàstek¡ |
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System analizy rozmiarów czàstek¡ |
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fluoroSENS – Fluorimeter |
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fluoroSENS Fluorimeter |
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Optomechanical Components from Ealing Catalog Inc. |
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Optomechanical Components from Ealing Catalog Inc. |
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Nanospectralyzer |
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Nanospectralyzer |
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Hyperspectral Imaging |
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Hyperspectral Imaging |
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Nano-DST |
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Nano-DST |
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Surface Plasmon Spectroscopy (SPS) |
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Surface Plasmon Spectroscopy (SPS) |
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MPMS SQUID VSM |
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MPMS SQUID VSM |
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VersaLab |
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VersaLab - 3 Tesla Cryogen-free VSM |
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Nanowizard |
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Nanowizard |
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Abrio/LC-PolScope |
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Abrio/LC-PolScope |
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CMOS Cameras for scientific and industrial applications |
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CMOS Cameras for scientific and industrial applications |
Kontakt |
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Contacts |
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Contacts |
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Thomas Beppler |
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Andreas Bergner |
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Henryk Dluzewski |
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Olivier Dubreuil |
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Hassan Farshchi |
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Michael Fichtner |
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Jürgen Fischbach |
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Michael Foos |
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Michael Foos |
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Wilfried Helle |
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Rainer Hess |
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Gerhard Jockwich |
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Ralph Köhler |
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Olaf Koschützke |
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Agnieszka Kowalczyk |
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Marc Kunzmann |
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Marc Kunzmann |
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Patrick Lindemann |
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Monica Martinez |
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Jochen Mentges |
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Thorsten Pieper |
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Stefan Riesner |
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Raimund Sauter |
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Jürgen Schlütter |
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Alexander Schrenk |
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Ralf Siegel |
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Karlheinz Szemeritsch |
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Jörg Tobisch |
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Natalia Tristan |
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Thomas Wagner |
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Joachim Weiss |
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Rainer Weißflog |
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Stefan Wittmer |
Wydarzenia |
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Events |
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LOT-Oriel - Events |
Spectrum |
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Spectrum |
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LOT-Oriel - Spectrum |
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European Edition 7 |
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European Edition 7 |
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Applied Nanostructures - AFM cantilevers |
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The Nano-DST™ - high-speed AFM with atomic resolution |
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The new Nano-E™ AFM system for standard research and education |
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Ellipsometry-Workshop 2008 |
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Photovoltaic applications of spectroscopic ellipsometry |
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Ellipsometry workshop, July 2nd 2008 in Spain |
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NewView 7000 series - advanced, high performance 3D optical profilers |
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High end Cheetah aims at high speed SWIR imaging |
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Everything you want to know about light sources |
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Magnetometry & More |
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Nano impact testing of surfaces |
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Informal seminar on measurements of mechanical properties |
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New Andover filter catalog |
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Visit the VLOC Waveplate Store |
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Disc centrifuge for high resolution particle size measurement |
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Thin film characterization by Surface Plasmon Resonance (SPR) |
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Studying cell interactions using the Q-Sense window module |
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European Edition 6 |
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Nano-DST |
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AFM cantilevers |
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Nano-Rp capabilities in particles characterization |
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BioMat workstation - imaging opaque samples |
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Training course on Ellipsometry data analysis |
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New camera developments in NIR and IR imaging |
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Citius high speed cameras |
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The iHelium-3 magnetometer |
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PPMS - The Swiss knife for your physical laboratory |
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IR floating zone furnace from Canon Machinery |
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High temperature nanoindentation |
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High throughput filters for fluorescence spectroscopy |
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Ultra steep short pass filters |
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New InGaAs detectors for NIR spectroscopy |
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QCM-D E4: Tracking changes at the surface |
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European Edition 5 |
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European Edition 5 |
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In-situ spectroscopic ellipsometry for ALD |
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Ellipsometry workshop 2007 |
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NIR cameras for the extended infrared |
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Centurio – a high-speed camera with a medium frame rate |
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Zygo’s aspheric interferometer |
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The next generation of solar simulators |
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UV-VIS mercury fiber optic illuminator |
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Light sources for research, development and industry |
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Quantum Design’s cryogen-free VSM – the VersaLab |
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Opti-MAxes – vector magneto-optic system from AMI |
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CellHesion module for the JPK BioAFM |
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HYDRA – a new generation of cantilevers |
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Nanocrystalline hydroxyapatite surfaces for biomaterial research |
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Ealing Catalog Inc. and LOT-Oriel – a strategic partnership |
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Diamond windows finally made affordable |
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New Andover filter catalog |
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CPS disc centrifuges – particle size measurement |
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Gilden Photonics monochromators and spectrographs |
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Sensitive fluorimeter at a sensible price |
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Time Resolved X-ray Diffraction with Andor CCD camera |
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Seminar Nanotest in Darmstadt |
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Spin Coater: tools for preparing ultrathin films for spectroscopic applications |
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European Edition 4 |
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Table of Contents |
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Nano Wizard II - the next generation in BioAFM from JPK |
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PNI presents: Second generation routine AFM systems |
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Sharp AFM cantilevers |
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Liquid helium level instruments for science and industry |
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Cold crystals CRYOCOOL-LHE |
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New heat cell for ellipsometers |
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Integrating spectroscopic ellipsometry into industrial applications |
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Xenics IR and NIR cameras |
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Maximum image quality at ultra fast speeds |
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Low light imaging - the Andor iXonEM+ |
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Enhance your optical surface form measurements |
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Hartmann Shack – beam diagnosis |
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Compact 150W Xe light source |
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The new light sources catalog |
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LOT-Oriel and LEJ - a strategic partnership |
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Quantum Design's new SQUID-based VSM |
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High-temperature nanoindentation on PET samples |
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55.000-pen two dimensional array - the next step in Dip-Pen Nanolithography (DPN) |
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Manipulating the nanoworld – Microgripper |
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Carbon nanotube characterization |
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Optical Filters VUV – FIR |
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Raman edge, notch and laser line filters |
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P-16 – KLA-Tencor's new surface profiler |
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Spin Coater: Tools for preparing ultrathin films for spectroscopic applications |
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European Edition 3 |
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Table of Contents |
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Europe is growing together |
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AFM - Sharp Cantilevers |
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Bio AFM |
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Nano-R Crystal Scanner |
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Optical Filters VUV - FIR |
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Varispec - Multispectral Imaging |
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Nuance Multispectral Imaging System |
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Large format InGaAs FPA cameras |
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Andor Catalog scientific Digital cameras solutions |
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DPSS-Nd:YAG BriteLight |
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Light Sources Catalog |
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Light Sources for Research, Development and Industry |
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NanoTest characterization of mechanical properties |
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Zyvex Nanotubes, Nanowires, Nanocoils |
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EasyTube 3000 for nanomaterials |
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Nanofabrication |
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Instruments for materials research/new materials |
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Nitrolab PPMS magnetic field temperature platform |
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Profilometric measurements on SIMS craters |
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newton CCD Cameras for spectroscopy |
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Quartz-Crystal-Microbalance |
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Interferometry |
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