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Witamy w LOT-Oriel |
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Witamy w LOT-Oriel - Lasers, Optics, Technology |
Oferta |
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Nano-DST |
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Nano-DST |
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Integrating Spheres |
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Integrating Spheres |
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Laser Publications |
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Laser Publications |
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Single Channel Detectors |
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Single Channel Detectors |
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Products |
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LOT-Oriel - Products |
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Filtry Optyczne, Soczewki, Akcesoria |
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Filtry Optyczne, Soczewki, Akcesoria |
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Źródła Światła, Monochromatory, Detektory |
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Źródła Światła, Monochromatory, Detektory |
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Analityka i Spektroskopia, Mikroskopia |
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Analityka i Spektroskopia, Mikroskopia |
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Lasery, optyka laserowa, akcesoria do laserów |
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Lasery, optyka laserowa, akcesoria do laserów |
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Obrazowanie, szybkie IR, metrologia |
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Obrazowanie, szybkie IR, metrologia |
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Nowe materiały, Właściwości fizyczne, Magnetometry |
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Nowe materiały, własności fizyczne, magnetometry |
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Metrologia powierzchniowa, cienkie warstwy, biointerfejsy |
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Metrologia powierzchniowa, cienkie warstwy, biointerfejsy |
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Nanotechnologia, SPM, AFM |
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Nanotechnology, SPM, AFM |
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Filtry do analizy fluorescencji |
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Filtry do analizy fluorescencji |
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Filtry Optyczne (VUV- FIR) |
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Filtry Optyczne (VUV- FIR) |
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Filtry przestrajane elektrycznie |
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Filtry przestrajane elektrycznie |
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Soczewki kwarcowe i szklane |
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Soczewki kwarcowe i szklane |
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Źródła światła dla prac badawczych, rozwojowych i przemysłu |
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Przestrzenny modulator światła (SLM) |
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Przestrzenny modulator świetlny (SLM) |
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Monochromatory i spektografy |
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Monochromatory i spektografy |
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Spectrographs |
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Monochromators |
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Wzorce odblaskowe i tarcze |
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Wzorce odblaskowe i tarcze |
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Detektory CDD/ICCD/EMCCD, Fotodiodi |
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EUV and X-Ray CCD Detectors |
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ICCD Detectors |
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CCD Line Detectors |
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Nuance – System obrazowania multispektralnego |
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Nuance – System obrazowania multispektralnego |
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Czujnik czoła fali |
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Czujnik czoła fali |
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Systemy kamer na podczerwień |
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Systemy kamer na podczerwień dla wszystkich długości fal |
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Objektywy IR |
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Objektywy IR |
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Profilometry |
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Profilometry |
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Kamery z rejestracją dużej szybkości – High speed cameras |
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Kamery z rejestracją dużej szybkości – High speed cameras |
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Magnetometr wibrującej próbki (VSM) |
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Vibrating Sample Magnetometer (VSM) |
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Magnetometr Kerra NanoMOKE2 |
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Magnetometr Kerra |
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Systemy mapowania (MOKE) |
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Systemy mapowania (MOKE) |
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Mapper Systems -Properties and Options |
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Mapper Systems - Applications and Systems |
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HTS – magnesy, doprowadzenia prądowe i komponenty |
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HTS – magnesy, doprowadzenia prądowe i komponenty |
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Cantilevers & AFM Calibration Standards |
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Cantilevers & AFM Calibration Standards |
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Elipsometry spektroskopowe |
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Elipsometry spektroskopowe |
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VASE |
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VUV-VASE |
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IR-VASE |
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M-2000 |
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MASE |
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Alpha-SE |
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Spectroscopic Ellipsometers Software |
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Spectroscopic Ellipsometers Application Notes |
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Woollam Ellipsometry Seminar |
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Elipsometry Spektroskopowe Seminar |
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Seminarium w zakresie zastosowania Elipsometrii |
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Lampy z wydrążoną katodą |
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Lampy z wydrążoną katodą |
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Lampy deuterowe |
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Lampy deuterowe |
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Akcesoria do spektroskopów FT- IR |
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Akcesoria do spektroskopów FT-IR |
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Lampy PID/Źródła liniowe |
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Lampy PID/Źródła liniowe |
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Maestro - System obrazowania in-vivo |
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Maestro - System obrazowania in-vivo |
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Powlekacz obrotowy |
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Powlekacz obrotowy |
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MPMS (Miernik własności magnetycznych) |
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MPMS XL (Miernik Własności Magnetycznych) |
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MPMS Evercool |
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Termografia impulsowa , nieniszczące testowanie |
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Termografia impulsowa, nieniszczące testowanie |
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ThermoScope II |
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Press Release - Shuttle Inspection |
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PPMS (Miernik własności fizycznych) |
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PPMS (Miernik własności fizycznych) |
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16 Tesla PPMS |
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P525 Vibrating Sample Magnetometer |
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Model P850 - PPMS Dilution Refrigerator System (DR) |
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Mikrowaga z kryształu kwarcu z monitoringiem rozpraszania (dyssypacji) energii QCM-D |
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Mikrowaga z kryształu kwarcu z monitoringiem rozpraszania (dyssypacji) energii QCM-D |
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Q-Sense E4 |
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Measurement Chamber Platform QCP 401 |
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Electronics Unit QE 401 |
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Q-Sense D300 |
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Measurement chamber QAFC 302 |
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Electronics unit QE 301 |
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Software QSoft 401 and QTools 2.0 |
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Sensor Crystals |
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Immobilization protocols |
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Układy pomiarowe ze SQUIDem (niska/ wysoka temperatura) |
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Układy pomiarowe ze SQUIDem (niska/ wysoka temperatura) |
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Fiber Optics |
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Fiber Optics |
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System analizy rozmiarów czàstek¡ |
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System analizy rozmiarów czàstek¡ |
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Nanospectralyzer |
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Nanospectralyzer |
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Obrazowanie hiperspektralne - Hyperspectral Imaging |
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Obrazowanie hiperspektralne - Hyperspectral Imaging |
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Surface Plasmon Spectroscopy (SPS) |
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Surface Plasmon Spectroscopy (SPS) |
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RT-08 from Res-Tec |
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SPR 200 from KSV |
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MPMS SQUID VSM |
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MPMS SQUID VSM |
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VersaLab |
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VersaLab - 3 Tesla Cryogen-free VSM |
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Nanowizard |
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Nanowizard |
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Cryo*Con |
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Cryo*Con |
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CT Systems for the µm and nm range |
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CT Systems for the µm and nm range |
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Nanotracker |
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Nanotracker - optical tweezers and 3D particle tracking system |
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CellHesion 200 |
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CellHesion 200 - single cell force testing solution for cell adhesion and elasticity studies |
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ForceRobot 200 |
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ForceRobot 200 |
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Odwzorowanie fotoluminescencji - Photoluminescence Mapper |
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Odwzorowanie fotoluminescencji - Photoluminescence Mapper |
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Ellipsometery dla Fotowoltaiki |
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Ellipsometery dla Fotowoltaiki |
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Solar Simulators |
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Solar Simlators |
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Kamery CCD |
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Kamery CCD |
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ZYGO, Rozwiązania dla fotowoltaiki |
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ZYGO, Rozwiązania dla fotowoltaiki |
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Kamery IR Xenics |
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Kamery IR Xenics |
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Photovoltaics |
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Fotowoltaika |
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BioMAT™ Workstation |
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BioMAT™ Workstation |
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WITec Alpha 300/500/700 |
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WITec Alpha 300/500/700 |
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Abrio/LC-PolScope |
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Abrio/LC-PolScope |
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CMOS Cameras for scientific and industrial applications |
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CMOS Cameras for scientific and industrial applications |
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NanoInk NLP 2000 |
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NanoInk NLP 2000 |
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NanoInk DPN 5000 Desktop NanoFabrication System |
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NanoInk DPN 5000 Desktop NanoFabrication System |
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System mierzenia nano- i mikrotwardości |
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NanoTest - Uniwersalna platforma do charakteryzacji właściwości mechanicznych |
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SPM insert for the QD PPMS |
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Spectral Evolution |
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Spectral Evolution |
Kontakt |
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Contacts |
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Contacts |
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David Appel |
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Thomas Beppler |
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Andreas Bergner |
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Henryk Dluzewski |
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Olivier Dubreuil |
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Hassan Farshchi |
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Michael Fichtner |
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Jürgen Fischbach |
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Michael Foos |
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Michael Foos |
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Wilfried Helle |
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Rainer Hess |
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Gerhard Jockwich |
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Ralph Köhler |
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Olaf Koschützke |
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Agnieszka Kowalczyk |
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Marc Kunzmann |
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Marc Kunzmann |
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Patrick Lindemann |
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Monica Martinez |
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Jochen Mentges |
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Thorsten Pieper |
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Stefan Riesner |
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Raimund Sauter |
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Jürgen Schlütter |
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Alexander Schrenk |
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Ralf Siegel |
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Karlheinz Szemeritsch |
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Jörg Tobisch |
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Natalia Tristan |
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Thomas Wagner |
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Joachim Weiss |
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Rainer Weißflog |
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Stefan Wittmer |
Wydarzenia |
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Events |
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LOT-Oriel - Events |
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Nanoscale Biomaterials Deposition |
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Nanoscale Biomaterials Deposition |
Spectrum |
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Spectrum |
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LOT-Oriel - Spectrum |
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European Edition 10 |
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Non-invasive 3D imaging in high resolution |
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Applications for SWIR InGaAs cameras |
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Citius imaging high speed video cameras |
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PTI250 – 3D measurement of hip and intervertebral disc implants |
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Interferometric metrology - VeriFire Asphere |
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Extended range of Fizeau objectives |
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PPMS-SPM – A brand new surface dimension in our Physical Property Measurement System |
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HTS-110 cryogen-free superconducting AC magnet |
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Nanoarrays made of hydrogel by DPN technology |
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Special offer: Nanospectralyzer™ for single-walled carbon nanotubes |
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In-situ combination of QCM-D and ellipsometry |
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Probe stations – test systems for chips and wafers |
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Specim launches Raman Spectrographs |
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High-sensitivity fluorescence spectroscopy with surface plasmons |
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European Edition 9 |
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New Cantilever Catalog |
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Ellipsometry-workshop 2009 |
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Training course on ellipsometry data analysis: CompleteEASE software |
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Quantitative force measurements with optical tweezers: The JPK NanoTracker™ |
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Immunohistochemistry – Multi-label microscopy without spectral or spatial cross-talk |
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Centurio C 100 – High-speed camera with new „data logger“ |
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Zygo fizeau interferometer to measure the shape of optical surfaces |
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Medical implant process control with ZYGO interferometers |
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ZYGO NewView for thin film solar cells |
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The new NLP 2000 – Nanofabrication made easy |
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DPN 5000 – The new flagship of Dip Pen Nanolithography |
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Characterisation of solar cells – Quantum efficiency measurements |
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SisuChema – Spatially resolved spectroscopy in chemistry, pharmacy and food technology |
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Explore the power of evanescent fields – Glass transition temperature in thin polymer films |
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CCD detectors for the quality control of solar cells |
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New from Andor: Microspectroscopy using dynamic slit |
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Structural change of adsorbed protein layer |
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Taking the chore out of running QCM-D experiments |
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European Edition 8 |
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HYDRA cantilevers for BioAFM |
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High-resolution imaging with the Bio-AFM system NanoWizard II |
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Photovoltaic in ellipsometry |
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Non-invasive 3D imaging of biological to advanced materials in high resolution |
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Extended coverage of XEVA and XS cameras from SWIR into the visible |
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Low cost CCD cameras with EM (electron multiplication) technology |
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Everything you want to know about light sources |
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The Cryogenic Control Systems – state-of-the-art electronic equipment |
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VersaLab VSM magnetometer – a new workhorse for magnetic material characterization |
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Optical filters UV – FIR |
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Multispectral imaging – quick and easy |
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New light source – the CPS disc centrifuge is now even more sensitive |
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Solar cell IV-curve characterization – virtually any application possible |
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Single wall carbon nanotubes: a new trend in biotechnology? |
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CCD line array cameras at good value for money |
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The RT-08 SPR spectrometer has arrived |
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European Edition 7 |
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Applied Nanostructures - AFM cantilevers |
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The Nano-DST™ - high-speed AFM with atomic resolution |
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The new Nano-E™ AFM system for standard research and education |
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Ellipsometry-Workshop 2008 |
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Photovoltaic applications of spectroscopic ellipsometry |
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Ellipsometry workshop, July 2nd 2008 in Spain |
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NewView 7000 series - advanced, high performance 3D optical profilers |
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High end Cheetah aims at high speed SWIR imaging |
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Everything you want to know about light sources |
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Magnetometry & More |
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Nano impact testing of surfaces |
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Informal seminar on measurements of mechanical properties |
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New Andover filter catalog |
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Visit the VLOC Waveplate Store |
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Disc centrifuge for high resolution particle size measurement |
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Thin film characterization by Surface Plasmon Resonance (SPR) |
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Studying cell interactions using the Q-Sense window module |
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European Edition 6 |
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Nano-DST |
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AFM cantilevers |
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Nano-Rp capabilities in particles characterization |
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BioMat workstation - imaging opaque samples |
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Training course on Ellipsometry data analysis |
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New camera developments in NIR and IR imaging |
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Citius high speed cameras |
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The iHelium-3 magnetometer |
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PPMS - The Swiss knife for your physical laboratory |
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High temperature nanoindentation |
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High throughput filters for fluorescence spectroscopy |
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Ultra steep short pass filters |
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New InGaAs detectors for NIR spectroscopy |
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QCM-D E4: Tracking changes at the surface |
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PDF Download |
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Subscription |
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Subscription |
