LOT-Oriel - Spectroscopic Ellipsometers Application Notes

OFERTA:

Choose a page from "Elipsometry spektroskopowe"

Spectroscopic Ellipsometers – Application Notes and Publications


Overview of Variable Angle Spectroscopic Ellipsometer (VASE), Part I: Basic Theory and Typical Applications
Abstract	PDF-Download (PDF, 1,3 MB)


Overview of Variable Angle Spectroscopic Ellipsometer (VASE), Part II: Advanced Applications
Abstract	PDF-Download (PDF, 503 KB)


Charakterisierung von Glasbeschichtungen mit Spektroskopischer Ellipsometrie
Abstract	PDF-Download (PDF, 195 KB)


Optical constants of 3,4,9,10-perylenetetracarboxylic dianhydride films on silicon and gallium arsenide studied by spectroscopic ellipsometry
Abstract	PDF-Download (PDF, 137 KB)


Variable Angle Spectroscopic Ellipsometry in the Vacuum Ultraviolet
Abstract	PDF-Download (PDF, 278 KB)


Optical characterization in the vacuum ultraviolet with Variable Angle Spectroscopic Ellipsometry: 157 nm and below
Abstract	PDF-Download (PDF, 156 KB)


Semiconductor superlattices
Abstract	PDF-Download (PDF, 242 KB)


Measurement of Silicon Doping Profiles using Infrared Ellipsometry Combined With Anodic Oxidation Sectioning
Abstract	PDF-Download (PDF, 1,6 MB)


IR-VASEª Messungen an einer dünner Silizium-Membran
Abstract	PDF-Download (PDF, 65 KB)


Characterisation of thin a-Si on c-Si using Multiple Sample Analysis
Abstract	PDF-Download (PDF, 59 KB)


VASEª Messungen an dünnen, beschichteten Mylarfolien
Abstract	PDF-Download (PDF, 174 KB)


DUV-VASEª Measurements of Photoresists and ARCs
Abstract	PDF-Download (PDF, 230 KB)


Bestimmung sehr geringer optischer Anisotropien in Polymerfolien mit dem Spektralellipsometer VASEª
Abstract	PDF-Download (PDF, 36 KB)


Spectroscopic ellipsometry and magneto-optic Kerr effects in Co/Pt multilayers
Abstract	PDF-Download (PDF, 517 KB)


In-Situ-Ellipsometrie zur Beschichtungssteuerung bei der Herstellung von Speichermedien
Abstract	PDF-Download (PDF, 33 KB)

International:

Szukaj:



→ Alphabetical Search Index → Sitemap

Your contact:

Henryk Dluzewski
Your contact in Poland
Phone: +48 322482048
Fax: +48 322482048
dluzewski@lot-oriel.com

Dr. Thomas Wagner
Phone: +49 6151 880668
Fax: +49 6151 896667
wagner@lot-oriel.de

Linki:

Nowości:


→	Large Area Imaging at -100 °C ....the Andor iKon-M (PDF, 246 KB)
→	Merger between LOT-Oriel Europe and Quantum Design (PDF, 56 KB)
→	Near Infrared Beam Profiler
→	New Ultra High Speed Camera Cheetah


	LOT-Oriel Polska E-mail: dluzewski@lot-oriel.com				Szyb Walenty 32 41-700 RUDA SLASKA, POLEN				Phone/Fax: 48 322482048		emotiv design