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α-SE™ –
alpha-Spectroscopic Ellipsometer

Fast, low-cost system for measuring film thickness and optical constants. Everything contained in amazingly small package. The ideal table top tool. Computer control through USB port.

EASY-TO-USE... push button operation with advanced software that takes care of the work for you.

FLEXIBLE... work with your materials - dielectrics, semiconductors, organics...

POWERFUL... proven SE technology gives you both thickness and index without the uncertainty of single-α ellipsometry or spectrophotometry. Measures depolarization and Mueller Matrix as well.



LOW COST... the power of SE at a much lower cost than a high-level research tool.

FAST... 100s of wavelengths simultaneously collected in seconds - immediate results.


Alpha-SE™ Software

Choose a model from a drop down list, a "Project" to save results in, and click "Measure" button. It's that simple!

Advanced Modeling Capabilities:
Disperion models to describe any material-Cauchy, Sellmeier, Lorentz, Gaussian, Tauc-Lorentz, Drude, etc...
Index Grading
Surface/interfacial roughness





Specifications

Spectral range: 370nm to 900nm (180 wavelengths)
Angle of incidence: 70° and 90°
Computer connection: USB (1.1 or higher)
Automated sample height adjustment
Data acquisition time:
- 3 sec. (Fast mode)
- 10 sec. (Standard mode)
- 30 sec. (Long mode)

Video
Alpha-SE Video (WMV, 1,3 MB)


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 Your contact:


Henryk Dluzewski
Your contact in Poland
Phone: +48 322482048
Fax: +48 322482048
dluzewski@lot-oriel.com



Dr. Thomas Wagner
Phone: +49 6151 880668
Fax: +49 6151 896667
wagner@lot-oriel.de

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www.QDUSA.com
External Links:
www.jawoollam.com

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Merger between LOT-Oriel Europe and Quantum Design (PDF, 56 KB)
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LOT-Oriel Polska
E-mail: dluzewski@lot-oriel.com

Szyb Walenty 32
41-700 RUDA SLASKA, POLEN

Phone/Fax: 48 322482048


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