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| Current developments in the solar energy market demand professional and high quality products that meet all the necessary requirements. The last few years there is an increasing demand for efficiency measurements on solar cells. As solar cell devices are getting better and better every day, good monitoring of the solar cell output is required. Improving solar cell material can only be achieved by reliable measurement feedback. | |
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 | efficient optical design
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| one sun irradiance up to 300 x 300 mm2 fields
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| different solar spectra with interchangeable filters
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| UV version available |
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Solar Cell IV curve measurement
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| Complete solar cell IV-curve tracing and analysis
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| IEC standards compliant
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| Reference cell corrected metrology
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| Wide range of solar simulators and Source-Meters controlled
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| Freely downloadable extension plug-ins add new instruments controlled and analysis techniques
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| Dark curve and temperature dependence analysis
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| Database connectors for SQL server and MySQL
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| Numerous solar cell material specific models included |
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Solar Cell Characterisation
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| Complete turnkey solution for spectral characterisation
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| Modular setup for maximum flexibility
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| All type of solar cells:
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 | polysilicon, c-Si, mc-Si, nc-Si
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| III/V compound cells
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| thin film: CdTe, CIS, CIGS, Si
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| 3rd generation: organic polymer, dye
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| Single and multijunction devices
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| Spectral range 200 – 2500nm
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| Variable bias light (white light or multicolour) |
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| Your contact: |
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Xavier Boira
Phone: +34 91 658 5052
Mobile: +34 687 982 811
Fax: +34 916 507 990
boira@lot-oriel.es
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