PRODUCTS:
 Optical Filters, Lenses, A...
 Light Sources, Monochromat...
 Analytics and Spectroscopy...
 Lasers, Laseroptics, Laser...
 IR cameras, Metrology
 New Materials Properties, ...
 Surface Metrology, Thin Fi...
 Nanotechnology, SPM, AFM

Nanotechnology, SPM, AFM
Nano-R2 and Nano-I2 – Routine AFM, excellent performance and quality at affordable price, for Imaging and Metrology Nanoink NScriptor™ DPNWriter™ – Dip Pen Nanolithographie™ (DPN™)
Cantilevers & AFM Calibration Standards Nanospectralyzer™ for Single-walled Carbon Nanotube (SWNT) Characterisation
JPK Nanowizard – Bio AFM Nano-DST™ – the new high end AFM system including a high-speed piezo scanner for video AFM measurements



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Quantum Design:
→ www.QDUSA.com

 News:
→ Merger between LOT-Oriel Europe and Quantum Design (PDF, 56 KB)
→ Near Infrared Beam Profiler
→ New Ultra High Speed Camera Cheetah

LOT-Oriel Iberia
E-mail: info@lot-oriel.es

C/ Caléndula 95
28109 ALCOBENDAS (MADRID), SPANIEN

Phone: +34-91-6585052
Fax: +34-91-6507990


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