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Spectrum - European Edition 9 (June 2009)

Table of Contents:

AFM – Our new cantilever catalog is online

Ellipsometry – Ellipsometry-workshop

Ellipsometry – Training course on ellipsometry data analysis: CompleteEASE software

Force measurements – Quantitative force measurements with optical tweezers: The JPK NanoTracker™

Imaging – Immunohistochemistry – Multi-label microscopy without spectral or spatial cross-talk

Imaging – Centurio C 100 – High-speed camera with new „data logger“

Interferometry – Zygo fizeau interferometer to measure the shape of optical surfaces

Interferometry – Medical implant process control with ZYGO interferometers

Interferometry – ZYGO NewView for thin film solar cells

Nanotechnology – The new NLP 2000 – Nanofabrication made easy

Nanotechnology – DPN 5000 – The new flagship of Dip Pen Nanolithography

Photovoltaics – Characterisation of solar cells – Quantum efficiency measurements

Spectroscopy – SisuChema – Spatially resolved spectroscopy in chemistry, pharmacy and food technology

Spectroscopy – Explore the power of evanescent fields – Glass transition temperature in thin polymer films

Spectroscopy – CCD detectors for the quality control of solar cells

Spectroscopy – New from Andor: Microspectroscopy using dynamic slit

Thin films – Structural change of adsorbed protein layer

Thin films – Taking the chore out of running QCM-D experiments

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News:


→	Cryostat for effective optical and electrical measurements from 3 K to 350 K
→	Spectrum European Edition 11 (June 10) is online!
→	Spectrum 118 (Juni 2010) is online!
→	Anasys Instruments: Nanoscale IR spectroscopy and thermal analysis
→	UV-VIS-NIR spectroradiometers designed for radiometric measurements and characterisation of artificial light sources and solar simulators
→	SPM insert for the QD PPMS®


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