Home |
 |
Welcome |
 |
|
Lasers, Optics, Technology |
Products |
 |
Products |
 |
|
LOT-Oriel - Products |
|
Optical Filters. Lenses, Accessories |
|
|
Optical Filters. Lenses, Accessories |
|
Light Sources, Monochromators, Detectors |
|
|
Light Sources, Monochromators, Detectors |
|
Analytics and Spectroscopy, Microscopy |
|
|
Analytics and Spectroscopy, Microscopy |
|
Lasers, Laser Optics, Laser Accessories |
|
|
Lasers, Laser Optics, Laser Accessories |
|
Imaging, Thermal/High Speed/C-MOS, Metrology |
|
|
Imaging, IR-/HighSpeed/C-MOS, Metrology |
|
Nanotechnology, SPM, AFM |
|
|
Nanotechnology, SPM, AFM |
|
Surface Metrology, Thin Films, Biointerfaces |
|
|
Surface Metrology, Thin Films, Biointerfaces |
|
New Materials, Physical Properties, Magnetometry |
|
|
New Materials, Physical Properties, Magnetometry |
|
Optical Filters (UV - FIR) |
|
|
Optical Filters (UV-FIR) |
|
Filters for Analyzing Fluorescence |
|
|
Filters for Analyzing Fluorescence |
|
Electrical Tunable Filters |
|
|
Electrically Tunable Filters - VariSpec |
|
Quartz and Glass Lenses |
|
|
Quartz and Glass Lenses |
|
Light Sources for Research, Development and Industry |
|
|
Light Sources for Research, Development and Industry |
|
Spatial Light Modulator (SLM) |
|
|
Spatial Light Modulator (SLM) |
|
Monochromators and Spectrographs |
|
|
Monochromators and Spectrographs |
|
CCD/ICCD/EMCCD Detectors |
|
|
CCD/ICCD/EMCCD Detectors |
|
|
CCD Detectors and InGaAs Photodiode Arrays |
|
|
UV and X-Ray CCD Detectors |
|
|
EMCCD Detectors |
|
|
EMCCD Interactive Tutorial |
|
|
ICCD Detectors |
|
|
ICCD Quantum Efficiencies in a Flash Animation |
|
|
CCD Line Detectors |
|
|
Spectrographs |
|
|
Quantum Register with Neutral Caesium Atoms |
|
|
About Andor |
|
|
Seminar CCD-, ICCD- und EMCCD-Detektoren |
|
Integrating Spheres |
|
|
Integrating Spheres |
|
FT-IR Spectroscopy Accessories |
|
|
FT-IR Spectroscopy Accessories |
|
Standards and Targets |
|
|
Standards and Targets |
|
Hollow Cathode Lamps |
|
|
Hollow Cathode Lamps |
|
Deuterium Lamps |
|
|
Deuterium Lamps |
|
PID Lamps/Line Sources |
|
|
PID Lamps/Line Sources |
|
Disc Centrifuge |
|
|
Disc Centrifuge |
|
Spin Coater/Dip Coater |
|
|
Spin Coater/Dip Coater |
|
Microscope Cameras |
|
|
Microscope Cameras |
|
Accessories for Microscopy |
|
|
Accessories for Microscopy |
|
Nuance |
|
|
Nuance |
|
Maestro In-Vivo Imaging System |
|
|
Maestro - In-Vivo Imaging System |
|
Nd:YAG-Lasers |
|
|
Nd:YAG-Lasers |
|
|
Brilliant, Brilliant B und Brio |
|
|
Briliiant B Press Information |
|
|
Ultra und CFR |
|
|
YG |
|
|
Industrial Laser Yasmin |
|
|
BriteLight - Diodengepumpte Nd:YAG-Laser (DPSS) mit hohen Leistungen |
|
|
DPSS-Laser Centurion |
|
|
Presseinfo Brilliant Ultra |
|
Dye Lasers |
|
|
Dye Lasers TDL90 |
|
OPO Systems |
|
|
OPO Systems |
|
PIV Lasers |
|
|
Double Pulse Lasers Twins / PIV-Laser |
|
Cleaning Lasers |
|
|
Cleaning Lasers |
|
Diamond Optics |
|
|
Diamond Optics |
|
Laser powermeter |
|
|
Laser Powermeter |
|
Laser Diagnostics |
|
|
Laser Diagnostics - Wavefront Sensor |
|
|
Propagationsanalyse von Laserstrahlung mit dem Wellenfrontsensor |
|
Infrared Camera Systems |
|
|
Infrared Camera Systems |
|
IR Lenses |
|
|
IR Lenses |
|
Pulsed Thermography |
|
|
Thermal Wave Imaging |
|
|
ThermoScope II |
|
|
Press Release - Shuttle Inspection |
|
Surface Profilers |
|
|
Profilers |
|
High Speed Cameras |
|
|
Highspeed Cameras |
|
Kerr Magnetometer |
|
|
Kerr Magnetometer NanoMOKE |
|
Vibrating Sample Magnetometer |
|
|
Vibrating Sample Magnetometer (VSM) |
|
|
VSM - Properties and Options |
|
|
VSM - Applications and Models |
|
|
VSM - Model Overview |
|
Disk and Wafer Mapping Systems |
|
|
Mapper Systems |
|
|
Mapper Systems -Properties and Options |
|
|
Mapper Systems - Applications and Systems |
|
MPMS-XL (Magnetic Property Measurement) |
|
|
MPMS-XL (Magnetic Property Measurement) |
|
PPMS |
|
|
PPMS Physical Property Measurement System |
|
|
16 Tesla PPMS |
|
|
P525 Vibrating Sample Magnetometer |
|
|
Model P850 - PPMS Dilution Refrigerator System (DR) |
|
High Temperature Superconducting Magnets, Current Leads and Components |
|
|
HTS-magnets, current leads and components |
|
Pressure Cell Modules for electrical and magnetical measurement |
|
|
High–Pressure Cell Modules for electrical and magnetical measurement |
|
SQUID Measurement Systems |
|
|
SQUID Measurement Systems |
|
Cantilevers & AFM Calibration Standards |
|
|
Cantilevers & AFM Calibration Standards |
|
Nano- and Micro Hardness Tester |
|
|
Nano- and Micro Hardness Tester |
|
ESCA System SAGE |
|
|
ESCA System SAGE |
|
|
SAGE HR |
|
Spectroscopic Ellipsometers |
|
|
Spectroscopic Ellipsometers |
|
|
VASE |
|
|
VUV-VASE |
|
|
IR-VASE |
|
|
M-2000 |
|
|
MASE |
|
|
Alpha-SE |
|
|
Spectroscopic Ellipsometers Software |
|
|
Spectroscopic Ellipsometers Application Notes |
|
Brewster Angle Microscope |
|
|
Brewster Angle Microscope |
|
Surface Chemistry |
|
|
Surface Chemistry |
|
|
KSV 5000 Langmuir Blodgett System |
|
|
KSV 3000 Langmuir Blodgett System |
|
|
KSV 2000 Langmuir Blodgett System |
|
|
KSV Minitrough |
|
|
Special Troughs |
|
|
Review Articles and Publications |
|
|
International KSV Distributors |
|
QCM-D Quartz Crystal Microbalance |
|
|
Quartz Crystal Microbalance |
|
|
Q-Sense E4 |
|
|
Measurement Chamber Platform QCP 401 |
|
|
Electronics Unit QE 401 |
|
|
Q-Sense E1 |
|
|
Software QSoft 401 and QTools 2.0 |
|
|
Sensor Crystals |
|
|
Immobilization protocols |
|
Nano-Ink NScriptor |
|
|
Nano-Ink NScriptor |
|
CMOS Cameras for scientific and industrial applications |
|
|
CMOS Cameras for scientific and industrial applications |
|
Single Channel Detectors |
|
|
Single Channel Detectors |
|
PNI - Nanotechnology Solutions |
|
|
Pacific Nanotechnology Inc. - Nanotechnology, Nano-R, Nano-I |
|
Fiber Optics |
|
|
Fiber Optics |
|
Nanospectralyzer |
|
|
Nanospectralyzer |
|
Intas Gel-Imager |
|
|
Intas Gel-Imager |
|
AMI Superconducting Magnet Systems |
|
|
AMI Superconducting Magnet Systems |
|
PSM – Potential-Seebeck Microprobe |
|
|
PSM – Potential-Seebeck Microprobe |
|
MPMS SQUID VSM |
|
|
MPMS SQUID VSM |
|
UVX Radiometer |
|
|
UVX Radiometer |
|
Reflecting Microscope Objectives |
|
|
Reflecting Microscope Objectives |
|
Abrio Imaging System |
|
|
Abrio/LC-PolScope |
|
Nano-DST |
|
|
Nano-DST |
|
Hyperspectral Imaging |
|
|
Hyperspectral Imaging |
|
VersaLab - 3 Tesla Cryogen-free VSM |
|
|
VersaLab - 3 Tesla Cryogen-free VSM |
|
IR Floating Zone Furnace |
|
|
IR Floating Zone Furnace |
|
Surface Plasmon Spectroscopy (SPS) |
|
|
Surface Plasmon Spectroscopy (SPS) |
|
FEI Phenom |
|
|
FEI Phenom |
|
Photovoltaic |
|
|
Photovoltaic |
|
Solar Simlators |
|
|
Solar Simlators |
|
Photovoltaic Panel Solutions |
|
|
Photovoltaic Panel Solutions |
|
fluoroSENS Fluorimeter |
|
|
fluoroSENS Fluorimeter |
Contacts |
|
Contacts |
|
|
Contacts |
|
|
Thomas Beppler |
|
|
Andreas Bergner |
|
|
Olivier Dubreuil |
|
|
Hassan Farshchi |
|
|
Michael Fichtner |
|
|
Jürgen Fischbach |
|
|
Michael Foos |
|
|
Michael Foos |
|
|
Wilfried Helle |
|
|
Rainer Hess |
|
|
Gerhard Jockwich |
|
|
Ralph Köhler |
|
|
Olaf Koschützke |
|
|
Marc Kunzmann |
|
|
Patrick Lindemann |
|
|
Monica Martinez |
|
|
Jochen Mentges |
|
|
Carsten Pape |
|
|
Thorsten Pieper |
|
|
Stefan Riesner |
|
|
Raimund Sauter |
|
|
Jürgen Schlütter |
|
|
Alexander Schrenk |
|
|
Ralf Siegel |
|
|
Karlheinz Szemeritsch |
|
|
Jörg Tobisch |
|
|
Natalia Tristan |
|
|
Thomas Wagner |
|
|
Joachim Weiss |
|
|
Rainer Weißflog |
|
|
Stefan Wittmer |
Events |
|
Events |
|
|
LOT-Oriel - Events |
Press |
|
Press Releases |
|
|
LOT-Oriel - Press Releases |
Spectrum |
|
Spectrum |
|
|
LOT-Oriel - Spectrum |
|
Deutsche Ausgabe 112 |
|
|
Inhaltsverzeichnis |
|
|
Strukturänderung in adsorbierten Proteinen - eine QCM-D-Studie |
|
|
Neue Kombinationsmöglichkeiten für die QCM-D-Technologie |
|
|
QCM-D-Sensorkristalle - Sonderaktion bis zum 31. Dezember 2008 |
|
|
Echtzeit-Ellipsometrie: Verfolgung des Oxidationsprozesses dünner organischer Schichte |
|
|
Nicht-invasive 3D-Bilderzeugung an biologischem und High-tech-Material |
|
|
XenICs weiterhin europäischer Technologieführer bei InGaAs-Kameras |
|
|
NewView 7000 für die industrielle Rautiefen- und Formmessung von Präzisionsteilen |
|
|
Strom-Spannungs-Messung an PV-Solarzellen |
|
|
Durchstimmbare monochromatische Lichtquellen |
|
|
Lichtquellen kauft man bei LOT |
|
|
Phenom Desktop-SEM - Topographie und Materialkontrast |
|
|
Biofunktionale DNA-Nanostrukturen |
|
|
Erzeugung von Bio-Nanostrukturen: „Just add DNA“ |
|
|
Manuelles Tensiometer |
|
|
Cantilever für nahezu jede Anwendung |
|
|
Die Scheibenzentrifuge ist jetzt noch empfindlicher |
|
|
Preiswerte CCD-Zeilenkameras für die Spektroskopie |
|
|
Single Wall Carbon Nanotubes - ein neuer Trend in der Biotechnologie? |
|
|
Modulares SPR-Spektrometer - jetzt im Applikationslabor |
|
|
Sonderangebot Atlas-Presse |
|
Deutsche Ausgabe 111 |
|
|
Inhaltsverzeichnis |
|
|
Die neuen HYDRA-Cantilever sind da |
|
|
Bonusaktion für Cantilever |
|
|
Ein hochauflösendes AFM für das PPMS |
|
|
High-End-AFM Nano-DST jetzt im Applikationslabor |
|
|
Sonderangebot Atlas-Presse |
|
|
Seminar „CCD-, ICCD- und EMCCD-Detektoren in Spektroskopie und Imaging“ |
|
|
Nanofretting |
|
|
Seminar Bestimmung mechanischer Eigenschaften dünner Schichten |
|
|
Sonderangebot Q-Sense E4 |
|
|
Newsletter von KSV |
|
|
Ellipsometrie-Seminar 2008 |
|
|
Andor CCD-Kamera für Elektro- und Photolumineszenz |
|
|
PiZzicato – der neue Pikosekunden Nd:YAG Laser mit Festkörper-Modenkopplung |
|
|
Lichtquellen kauft man bei LOT |
|
|
Kieselalgen mit dem Desktop-SEM |
|
|
Filter für die Fluoreszenzspektroskopie |
|
|
P6 – der neue Stylus-Profiler von KLA-Tencor |
|
|
Ortsaufgelöste Spektroskopie |
|
|
Glasübergangstemperatur in dünnen Polymerschichten mit SPR-Spektroskopie |
|
|
CryoCon – der Name ist Programm |
|
|
Heliumverflüssiger – einfach cool |
|
Deutsche Ausgabe 110 |
|
|
Inhaltsverzeichnis |
|
|
Atlas-Presse - auch voll programmierbar |
|
|
Golden Gate - jetzt noch heißer |
|
|
Preissenkung bei HKL-Lampen |
|
|
Neue großformatige iKon-L CCD-Detektoren von Andor Technology |
|
|
Neues Elektrochemie-Modul von Q-Sense |
|
|
Noch mehr Neues für die Elektrochemie |
|
|
Seminar „Bestimmung mechanischer Eigenschaften dünner Schichten“ |
|
|
Gobi – nicht die Wüste, sondern die neue Miniaturwärmebildkamera |
|
|
Universelles Weisslichtinterferometer NV7000™ |
|
|
Lichtquellen kauft man bei LOT |
|
|
PSM – die Potential-Seebeck-Mikrosonde |
|
|
Erste Anwenderseminare Korngrößenmessung |
|
|
AMI – Nutzen Sie den sehr günstigen Dollarkurs! |
|
|
Reflektive Mikroskopobjektive – Preissenkung |
|
|
Phenom: Hochauflösende Mikroskopie in einer neuen Dimension |
|
|
Testen Sie unser AFM-System |
|
|
Sonderaktion: AFM-Cantilever von Applied Nanostructures |
|
|
ZnSe/ZnS – Rohmaterial von II-VI Incorporated |
|
|
Neues Stylus-Profilometer P6 |
|
|
Ellipsometrie-Seminar 2008 |
|
|
Verzögerungsplatten von VLOC im WaveplateStore online bestellen |
|
|
Jetzt geht die Sonne auf |
|
|
Wir stellen vor: Monica Martinez |
|
Deutsche Ausgabe 109 |
|
|
Inhaltsverzeichnis |
|
|
Neue QCM-D-Einsatzmöglichkeiten mit dem E1 |
|
|
Woollam Newsletter – Neues Ellipsometer mit zwei rotierenden Kompensatoren |
|
|
High Speed NIR-Bildverarbeitung mit der Cheetah |
|
|
Wanted: Perkin-Elmer 983 oder 781 |
|
|
Farbstofflaser TDL90 - Die Wahl der richtigen Konfiguration |
|
