PRODUCTS:
 Optical Filters, Lenses, A...
 Light Sources, Monochromat...
 Analytics and Spectroscopy...
 Lasers, Laseroptics, Laser...
 Imaging, IR-/HighSpeed, Me...
 New Materials Properties, ...
 Surface Metrology, Thin Fi...
 Nanotechnology, SPM, AFM
 Photovoltaic














Profilers

Rapid developments in the areas of nanotechnology, precision mechanics and thin-film technology, as well as the development of novel materials necessitate increasingly precise knowledge of the surface of the workpiece or the material to be processed as well as quality control after processing.

The profilometers manufactured by KLA-Tencor are optimally suited to meet these increasingly stringent requirements with regard to quality assurance in production, research, and service settings.



PDF Download
Surface Profiler AlphaStep IQ (PDF, 435 KB)
P-16+ Surface Profiler (PDF, 300 KB)
P-6 Stylus Profiler (PDF, 271 KB)
Film Stress Measurement System Flexus FLX-2320 S (PDF, 393 KB)
Film Stress Measurement System FLX 3300, 300 mm Version (PDF, 96 KB)
Apex Software (PDF, 588 KB)
Apex 2D/3D in a few minutes – Information Note (PDF, 159 KB)

Laboratory



 International:

 Search:

Alphabetical Search Index
Sitemap
Impressum

 Your contact:


Rainer Weißflog
Phone: +49 06151 8806-13
Fax: +49 06151 8806-913
weissflog@lot-oriel.de

 Links:
Quantum Design:
www.qd-international.com

 News:
Spectrum European Edition 11 (June 10) is online!
Spectrum 118 (Juni 2010) is online!
Anasys Instruments: Nanoscale IR spectroscopy and thermal analysis
UV-VIS-NIR spectroradiometers designed for radiometric measurements and characterisation of artificial light sources and solar simulators
SPM insert for the QD PPMS®

LOT-Oriel GmbH & Co. KG
E-mail: info@lot-oriel.de

Im Tiefen See 58
D-64293 Darmstadt

Phone: +49 6151 - 88 06 0
Fax: +49 6151 - 896667


emotiv design