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Phenom: The worlds fastest electron microscope
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The rapidly accelerating pace of development in micro- and nanotechnologies has created growing demand for imaging capability beyond the 1000X magnification from a typical light microscope. Scanning electron microscopes (SEM) can generate useable information at magnifications higher than 100.000X, but they are typically slower, harder to use and more expensive than light microscopes. Now, an innovative benchtop imaging system (PhenomTM, FEI Company) combines the power of SEM with the speed and convenience of light microscopes, delivering crisp, clear images at magnifications up to 24.000X.
PHENOM – Roadshow Germany
Main features include:
 | Easy for everyone to operate
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| Touchscreen controlled
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| Sample load time <30 seconds
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| Material and Topography Contrast
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| 100x better depth of focus compared to light microscope
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| Dazzle-free images of shiny and glossy surfaces |
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| Fully automated inspection, analysis and statistical evaluation of filters, micro- and nanofibers with Fibermetric™ and Phenom, the worlds fastest electron microscope. Fibermetric integrates the automated measurement and statistical analysis of fiber material with the outstanding functionality of the Phenom desktop imaging SEM. |
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FEI Fibermetric in brief:
| Simple inspection of almost any fiber material (woven and non-woven)
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| Resolution >= 30nm at max. 24.000X magnification
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| Number of fibers and pores
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| Fiber thickness, length and direction
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| Pore size distribution
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| High accuracy down to sub-micrometer range
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| Fully automated statistics (up to 100.000 measurements per sample in just a few minutes)
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| Export of results via XML file format for further data processing
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| What usually takes you hours to analyse is now a matter of minutes and saves your time and money |
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Links to "phenom-world.com"
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