PRODUCTS:
 Optical Filters, Lenses, A...
 Light Sources, Monochromat...
 Analytics and Spectroscopy...
 Lasers, Laseroptics, Laser...
 Imaging, IR-/HighSpeed, Me...
 New Materials Properties, ...
 Surface Metrology, Thin Fi...
 Nanotechnology, SPM, AFM
 Photovoltaic

















Bridging the gap between optical and electron microscopy

Phenom is a high resolution desktop imaging tool with an optical camera for never-lost navigation and a high quality electron microscope for detailed imaging. Its innovative user interface and intuitive touch screen control produce superb quality images with minimal operator training. It can handle a wide range of samples with minimal preparation. Samples are loaded instantly with Phenom’s patented vacuum technology. Images are saved on a USB memory stick for off-line analysis, measurements and distribution.

Key specifications
Magnification range 20 - 20,000x (Digital zoom 12x)
Maximum image resolution 2048x2048 pixels
Sample loading time < 30 Seconds
Total weight 55kg
Motorized sample control







Messetermine 2008/2009:

03.-06.12.2008 Euromold Halle/Stand 6/E63 in Frankfurt
25.-26.03.2009 BIAK in Berlin

PDF Download
Phenom Brochure (PDF, 1,2 MB)
Specifications (PDF, 178 KB)
Antwortfax PHENOM-Produktpräsentation (PDF, 58 KB)

Application Notes
Feature Measurement with Phenom using MeasureIT (PDF, 301 KB)
Metallurgical Mount Sample Holder (PDF, 143 KB)
Multiple Image Alignment (PDF, 729 KB)
SEMinal particle morphology analysis (PDF, 601 KB)
Phenom Advantages in Forensics (PDF, 536 KB)
Topography Imaging with Phenom (PDF, 398 KB)
Benchtop Microscopy at 20,000X – faster than the speed of light (PDF, 329 KB)
Microscopic Investigation of a Metallurgical Mount (PDF, 567 KB)
Phenom Use for Pharmaceutical Inspection (PDF, 543 KB)
Phenom Imaging by Backscattered Electron Detection (PDF, 388 KB)
Taking Phenom anywhere you want (PDF, 123 KB)
Diatoms tell the Truth about our Environment (PDF, 207 KB)
Influence of Music on Crystal Growth (PDF, 744 KB)



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 Your contact:
Carsten Pape
Phone: 06151 8806 21
Fax: 06151 8806 89
pape@lot-oriel.de



Dr. Jürgen Schlütter
Phone: +49 6151 880644
Fax: +49 6151 880689
schluetter@lot-oriel.de

 Links:
Quantum Design:
www.QDUSA.com

 News:
Stellenangebot Materialforschung/Dünnschichtanalyse
Spectrum 112 (October 2008) is online!
Large Area Imaging at -100 °C ....the Andor iKon-M (PDF, 246 KB)
Merger between LOT-Oriel Europe and Quantum Design (PDF, 56 KB)
Near Infrared Beam Profiler
New Ultra High Speed Camera Cheetah

LOT-Oriel GmbH & Co. KG
E-mail: info@lot-oriel.de

Im Tiefen See 58
D-64293 Darmstadt

Phone: +49 6151 - 88 06 0
Fax: +49 6151 - 896667


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