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 Surface Metrology, Thin Fi...
 Nanotechnology, SPM, AFM
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Nanotechnology, SPM, AFM

Nanospectralyzer™ für Single-walled Carbon Nanotube (SWNT) Charakterisierung NLP 2000 – A nanolithography platform for simple desktop nanofabrication
Nanoindentation – Mechanical Properties of thin films DPN 5000 – Desktop NanoFabrication System
Cantilever & AFM Kalibrationsstandards Phenom Desktop Electron Microscope
SPM insert for the QD PPMS®  



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 Links:
Quantum Design:
www.qd-international.com

 News:
Spectrum 117 (March 2010) is online!
UV-VIS-NIR spectroradiometers designed for radiometric measurements and characterisation of artificial light sources and solar simulators
Invitation to the Webinar "Nanoscale Biomaterials Deposition - Learning to Speak the Language of Biology" March 16th, 2010 at 6:00 pm CET
European Conference on Nano Films
We grieve for Gerhard Jockwich.
VC OEM camera modules
Rasterelektronenmikroskop PHENOM im Schülerlabor
Spectrum - European Edition 10 (November 2009) is online!
SPM insert for the QD PPMS®

LOT-Oriel GmbH & Co. KG
E-mail: info@lot-oriel.de

Im Tiefen See 58
D-64293 Darmstadt

Phone: +49 6151 - 88 06 0
Fax: +49 6151 - 896667


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