PRODUCTS:
 Optical Filters, Lenses, A...
 Light Sources, Monochromat...
 Analytics and Spectroscopy...
 Lasers, Laseroptics, Laser...
 Imaging, IR-/HighSpeed, Me...
 New Materials Properties, ...
 Surface Metrology, Thin Fi...
 Nanotechnology, SPM, AFM
 Photovoltaic

Surface Metrology, Thin Films, Biointerfaces
Cantilevers & AFM Calibration Standards Surface Chemistry (Tensiometer/LB Technology)
Contact Angle Meters
Spectroscopic Ellipsometers KSV Optrel BAM – Brewsterangle Microscope for LB Systems
Nano- and Micro Hardness Testing Profilers, Stress Measurement Systems
ESCA System SAGE Particle Size Analyzer (Disc Centrifuge)
Q-Sense - QCM-D is used to study (bio)molecular interactions and molecular adsorption to different surfaces in real time PSM – Potential-Seebeck Microprobe – A multidisciplinary measurement technique
Surface Plasmon Spectroscopy (SPS) Hyperspectral Imaging



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 Links:
Quantum Design:
→ www.QDUSA.com

 News:
→ Stellenangebot Materialforschung/Dünnschichtanalyse
→ Spectrum 112 (October 2008) is online!
→ Large Area Imaging at -100 °C ....the Andor iKon-M (PDF, 246 KB)
→ Merger between LOT-Oriel Europe and Quantum Design (PDF, 56 KB)
→ Near Infrared Beam Profiler
→ New Ultra High Speed Camera Cheetah

LOT-Oriel GmbH & Co. KG
E-mail: info@lot-oriel.de

Im Tiefen See 58
D-64293 Darmstadt

Phone: +49 6151 - 88 06 0
Fax: +49 6151 - 896667


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