PRODUCTS:
 Optical Filters, Lenses, A...
 Light Sources, Monochromat...
 Analytics and Spectroscopy...
 Lasers, Laseroptics, Laser...
 Imaging, IR-/HighSpeed, Me...
 New Materials Properties, ...
 Surface Metrology, Thin Fi...
 Nanotechnology, SPM, AFM
 Photovoltaic














Analytics and Spectroscopy, Microscopy

THz-spectroscopy and 3D imaging
the first commercial THz-spectrometer and 3D imaging system
Phenom Desktop Electron Microscope
FT-IR Spectroscopy Accessories Nanospectralyzer™ for Single-walled Carbon Nanotube (SWNT) Characterisation
Reflectance Standards and Targets CT Systems for the µm and nm range
Hollow Cathode Lamps CCD, ICCD and EMCCD Detectors for Spectroscopy
Deuterium Lamps Gel-Imager from Intas
PID-Lamps/Line Sources Nuance – Multi Spectral Imaging System
Particle Size Analyzer (Disc Centrifuge) Maestro in-vivo Imaging System
Spin Coater Abrio™/LC-PolScope™
Dip Coater Hyperspectral Imaging, Spectralcameras, NIR Chemical Imaging
UV-VIS-NIR Spectroradiometer  



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 Links:
Quantum Design:
www.qd-international.com

 News:
Spectrum 117 (March 2010) is online!
UV-VIS-NIR spectroradiometers designed for radiometric measurements and characterisation of artificial light sources and solar simulators
Invitation to the Webinar "Nanoscale Biomaterials Deposition - Learning to Speak the Language of Biology" March 16th, 2010 at 6:00 pm CET
European Conference on Nano Films
We grieve for Gerhard Jockwich.
VC OEM camera modules
Rasterelektronenmikroskop PHENOM im Schülerlabor
Spectrum - European Edition 10 (November 2009) is online!
SPM insert for the QD PPMS®

LOT-Oriel GmbH & Co. KG
E-mail: info@lot-oriel.de

Im Tiefen See 58
D-64293 Darmstadt

Phone: +49 6151 - 88 06 0
Fax: +49 6151 - 896667


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