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NanoTest – A Universal Platform for the Characterization of Mechanical Properties

With the NanoTest system, Micro Materials Ltd. offers a universal platform for different methods to characterize the mechanical properties of surfaces and thin films. The modularity of the system allows to combine all the measurement modules or to tailor the system according dedicated applications.

Two loading heads alternatively or in combination features nano and micro hardness testing. The special pendulum design, provides full modularity and excellent performance, as well as full ISO 14577 compliant. The NanoTest has the lowest drift rate of all instruments in the market, either at room temperature or at elevated temperature, which allows to apply a wide range of loading rates during indentation for very slow or fast loading.






The NanoTest system includes and serves the following methods and applications:

Measurement of hardness and modulus of solids and thin films by micro and nano indentation technique.
Temperature dependent measurements at elevated temperature up to 750°C
Creep

Elevated Temperature Nanoindentation Testing (PDF, 1,3 MB)

Nano-scratch and nano-wear testing on surfaces and adhesion of films
Obtain reliable quantified data on depth and frictional changes corresponding to each failure event

NanoTest Nano-Scratch and Nano-Wear Testing Module (PDF, 567 KB)

Nano-Impact and nano-fatigue testing, including dynamic hardness
Piezo sample oscillation impact for high cycle fatigue testing
Impuls impact for low cycle fatigue testing

Nano-Impact and Nanofatigue Testing (PDF, 1 MB)

Nanomechanical testing of polymer materials
NT with high resolution measurements, high thermal stability and minimal thermal drift
Ultra-high strain rate testing
Test in fluid environment

Nanomechanical Testing of Polymeric Materials (PDF, 581 KB)
Nanotest Fluid Cell (PDF, 367 KB)
Nanotest NTX Controller (PDF, 783 KB)


Links

Micro Materials Seminar 2010
www.micromaterials.co.uk
Laboratory


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Dr. Thomas Wagner
Phone: +49 6151 880668
Fax: +49 6151 896667
wagner@lot-oriel.de

 Links:
Quantum Design:
www.qd-international.com
Related pages:
Spectroscopic Ellipsometers
External Links:
www.micromaterials.co.uk

 News:
Spectrum European Edition 11 (June 10) is online!
Spectrum 118 (Juni 2010) is online!
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UV-VIS-NIR spectroradiometers designed for radiometric measurements and characterisation of artificial light sources and solar simulators
SPM insert for the QD PPMS®

LOT-Oriel GmbH & Co. KG
E-mail: info@lot-oriel.de

Im Tiefen See 58
D-64293 Darmstadt

Phone: +49 6151 - 88 06 0
Fax: +49 6151 - 896667


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