SPECTRUM:

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Spectrum - European Edition 9 (June 2009)

Table of Contents:

AFM – Our new cantilever catalog is online

Ellipsometry – Ellipsometry-workshop

Ellipsometry – Training course on ellipsometry data analysis: CompleteEASE software

Force measurements – Quantitative force measurements with optical tweezers: The JPK NanoTracker™

Imaging – Immunohistochemistry – Multi-label microscopy without spectral or spatial cross-talk

Imaging – Centurio C 100 – High-speed camera with new „data logger“

Interferometry – Zygo fizeau interferometer to measure the shape of optical surfaces

Interferometry – Medical implant process control with ZYGO interferometers

Interferometry – ZYGO NewView for thin film solar cells

Nanotechnology – The new NLP 2000 – Nanofabrication made easy

Nanotechnology – DPN 5000 – The new flagship of Dip Pen Nanolithography

Photovoltaics – Characterisation of solar cells – Quantum efficiency measurements

Spectroscopy – SisuChema – Spatially resolved spectroscopy in chemistry, pharmacy and food technology

Spectroscopy – Explore the power of evanescent fields – Glass transition temperature in thin polymer films

Spectroscopy – CCD detectors for the quality control of solar cells

Spectroscopy – New from Andor: Microspectroscopy using dynamic slit

Thin films – Structural change of adsorbed protein layer

Thin films – Taking the chore out of running QCM-D experiments

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Links:


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Aktuelles:


→	Das Spectrum 117 (März 2010) ist online!
→	UV-VIS-NIR Spektroradiometer die besonders für radiometrische Messungen und die Charakterisierung künstlicher Lichtquellen
→	Invitation to the Webinar "Nanoscale Biomaterials Deposition - Learning to Speak the Language of Biology" March 16th, 2010 at 6:00 pm CET
→	European Conference on Nano Films
→	Wir trauern um Gerhard Jockwich
→	OEM CMOS-Kameramodule
→	Rasterelektronenmikroskop PHENOM im Schülerlabor
→	Spectrum - European Edition 10 (November 2009) ist online!
→	Rastersonden-Mikroskop-Einsatz für das QD PPMS®


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