LOT-Oriel - European Edition 7

SPECTRUM:

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Spectrum - European Edition 7 (June 2008)

Table of Contents:

AFM – Applied Nanostructures - AFM cantilevers

AFM – The Nano-DST™ - high-speed AFM with atomic resolution

AFM – The new Nano-E™ AFM system for standard research and education

Ellipsometry – Ellipsometry-Workshop 2008

Ellipsometry – Photovoltaic applications of spectroscopic ellipsometry

Ellipsometry – Ellipsometry workshop, July 2nd 2008 in Spain - a one-day introduction

Imaging – High end Cheetah aims at high speed SWIR imaging

Interferometry – NewView 7000 series - advanced, high performance 3D optical profilers

Light sources – Everything you want to know about light sources

Magnetometry – PPMS - Magnetometry & More

Material properties – Nano impact testing of surfaces

Material properties – Informal seminar on measurements of mechanical properties

Optics – New Andover filter catalog

Optics – Visit the VLOC “Waveplate Store” – now online!

Particle size – Disc centrifuge for high resolution particle size measurement

Thin films – Thin film characterization by Surface Plasmon Resonance (SPR)

Thin films – From below and above - studying cell interactions using the Q-Sense window module

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Links:


Quantum Design:
→	www.QDUSA.com

Aktuelles:


→	Stellenangebot Materialforschung/Dünnschichtanalyse
→	Large Area Imaging at -100 °C ....the Andor iKon-M (PDF, 246 KB)
→	Merger between LOT-Oriel Europe and Quantum Design (PDF, 56 KB)
→	Near Infrared Beam Profiler
→	New Ultra High Speed Camera Cheetah


	L.O.T.-Oriel AG E-mail: suisse@lot-oriel.com				Moulin-du-Choc CH-1122 Romanel-sur-Morges				Tel.: +41 21 869 90 33 Fax: +41 21 869 93 08		emotiv design