LOT-Oriel - Table of Contents

SPECTRUM:

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Spectrum - European Edition 3 (May 2006)

Table of Contents:

Europe is growing together... at least at LOT-Oriel...

AFM – Sharp Cantilevers

AFM – Nano-R™ Crystal Scanner™

AFM – Bio AFM - AFM systems for research in life sciences

Filters – Optical Filters

Filters – VariSpec - Multispectral imaging Quick and easy

Imaging – Nuance Multispectral Imaging System

Imaging – Large format InGaAs FPA cameras

Imaging – New Andor Catalog „Scientific Digital Cameras Solutions“

Lasers – DPSS-Nd:YAG BriteLight

Light Sources – The new light sources catalog is now available

Light Sources – Light Sources for Research, Development and Industry

Nanotechnology – NanoTest – a universal platform for the characterization of mechanical properties

Nanotechnology – Property characterization of Nanotubes, Nanowires and Nanocoils

Nanotechnology – EasyTube™ 3000 for nanomaterials

Nanotechnology – Nanofabrication

New Materials – Instruments for materials research/new materials

New Materials – Nitrolab PPMS - A new magnetic field temperature platform for material characterization

Profilometry – Profilometric measurements on SIMS craters

Spectroscopy – Newton – the most sensitive CCD-cameras for spectroscopy

Surfaces – Quartz-Crystal-Microbalance - Tracking changes at surfaces

Surfaces – Interferometry at its best

Surfaces – Spectroscopic Ellipsometers - Thin film characterization

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Links:


Quantum Design:
→	www.QDUSA.com

Aktuelles:


→	Stellenangebot Materialforschung/Dünnschichtanalyse
→	Large Area Imaging at -100 °C ....the Andor iKon-M (PDF, 246 KB)
→	Merger between LOT-Oriel Europe and Quantum Design (PDF, 56 KB)
→	Near Infrared Beam Profiler
→	New Ultra High Speed Camera Cheetah


	L.O.T.-Oriel AG E-mail: suisse@lot-oriel.com				Moulin-du-Choc CH-1122 Romanel-sur-Morges				Tel.: +41 21 869 90 33 Fax: +41 21 869 93 08		emotiv design