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Photon instruments measure and analyze laser beams and other light sources, such as laser diodes (LDs), light emitting diodes (LEDs), optical fiber, waveguides, and VCSELS. Beams are characterized for both pulsed and continuous wave (CW sources using scanning slits, CCD arrays, knife-edge, and goniometric radiometer technologies, from ultraviolet (UV) to far infrared (FIR) wavelengths, and for spot sizes from submicron to several centimeters wide. Whether you're measuring a collimated, nearly-collimated, or very divergent beam, in the near field or far field, Photon has a profiler to give you accurate, reliable, and repeatable measurement results.
Nanoscan/BeamScan – slit-based real-time beam profiler, providing fast, accurate and easy-to-use measurements of collimation, divergence, and focused beams. Systems available to measure spot sizes from 4 µm to 25 mm, wavelengths from UV to FIR (>20 µm). | |
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BeamProfiler – video CCD profilers and beam analysis system for both pulsed and CW beams, with products for UV or NIR wavelength characterizations.
Far-Field Profilers – goniometric radiometer instruments, some of which can measure mode field diameter (MFD), effective area (Aeff), and numerical aperture (NA) of optical fiber with high or very high dynamic range.
SpotScan – uses knife-edge technology to measure submicron spot sizes. |
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