PRODUCTS:
 Optical Filters, Lenses, A...
 Light Sources, Monochromat...
 Analytics and Spectroscopy...
 Lasers, Laseroptics, Laser...
 IR cameras, Metrology
 New Materials Properties, ...
 Surface Metrology, Thin Fi...
 Nanotechnology, SPM, AFM

Nanotechnology, SPM, AFM
Nano-R2 and Nano-I2 – Routine AFM, excellent performance and quality at affordable price, for Imaging and Metrology Nanoink NScriptor™ DPNWriter™ – Dip Pen Nanolithographie™ (DPN™)
Cantilevers & AFM Calibration Standards Nanoindentation – Mechanical Properties of thin films
Nanospectralyzer™ for Single-walled Carbon Nanotube (SWNT) Characterisation  



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Quantum Design:
→ www.QDUSA.com

 News:
→ Stellenangebot Materialforschung/Dünnschichtanalyse
→ Large Area Imaging at -100 °C ....the Andor iKon-M (PDF, 246 KB)
→ Merger between LOT-Oriel Europe and Quantum Design (PDF, 56 KB)

LOT-Oriel GmbH & Co. KG
E-mail: struyve@lot-oriel.com

Im Tiefen See 58
D-64293 Darmstadt

Phone: +32 57 36 39 54
Fax: +32 57 36 09 54


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