PRODUCTS:
 Optical Filters, Lenses, A...
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 IR cameras, Metrology
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 Surface Metrology, Thin Fi...
 Nanotechnology, SPM, AFM







Analytics and Spectroscopy, Microscopy

FT-IR Spectroscopy Accessories Nanospectralyzer™ for Single-walled Carbon Nanotube (SWNT) Characterisation
Reflectance Standards and Targets Microscope Cameras
Nuance – Multi Spectral Imaging System CCD, ICCD and EMCCD Detectors for Spectroscopy
Maestro in-vivo Imaging System Micro Manipulator and Accessories for Microscopy
Abrio™/LC-PolScope™ UVX Radiometer



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Quantum Design:
www.QDUSA.com

 News:
Stellenangebot Materialforschung/Dünnschichtanalyse
Large Area Imaging at -100 °C ....the Andor iKon-M (PDF, 246 KB)
Merger between LOT-Oriel Europe and Quantum Design (PDF, 56 KB)

LOT-Oriel GmbH & Co. KG
E-mail: struyve@lot-oriel.com

Im Tiefen See 58
D-64293 Darmstadt

Phone: +32 57 36 39 54
Fax: +32 57 36 09 54


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