Photovoltaic Panel Solutions

Increasing efficiency while lowering costs

ZYGO's metrology expertise is providing photovoltaic manufacturers with the process insight needed to improve production control for higher efficiencies and lower costs.

NewView 3DPV-TF

ZYGO's NewView 3DPV-TF can be delivered either as an R&D instrument or a production-ready gantry-level system for in-process inspection. Measurement types include:

• TCO: Simultaneous measurement of both TCO surface roughness and thickness, anywhere on the panel without contact.

• Laser Scribe: Depth, Width, Profile, and Debris.

NewView 3DPV-W

• Wafer Texture: Minimize etching time while removing saw damage and increasing photon absorption.

• Conductor Grid: Unique 3D Cross Sectional Area metrology helps reduce Ag variations and waste.
  
  

• Laser - Edge Isolation: Helps optimize edge isolation and minimize surface debris.

Brochures

Wafer Based Processes
Thin Film Processes

Technical Papers

Transparent film profiling and analysis by interference microscopy