Xenics IR cameras

More and more, our NIR and SWIR cameras are used for the spatial characterization of wafers and solar cells. To analyze the material characteristics, the spectrum of the luminescent radiation of silicon in the NIR is depicted two-dimensionally. The wafers are transparent in the NIR so that errors or defects below the wafers may be non-destructively detected. As a cost-saving measure, silicon blocks may be examined for defects and inclusions in the NIR even before processing.

Left: Luminescence Image of a solar cell, 1450nm long wave pass filter. Right: Luminescence Image of a solar cell, full spectrum.

Overview of all Infrared and Near Infrared Camera Systems

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XEVA 1.7 320 TE1 VISNIR – XS 1.7 320 VISNIR

NIR and SWIR Cameras - Overview

XEVA XS Miniature NIR Camera

XEVA-MCT NIR camera with extended spectral range up to 2500 nm

NIR camera system XEVA with optional cooler

NIR camera system XEVA Large with large format array

MID camera Onca MWIR with MCT or InSb detector