The highly affordable NewView 600s provides fast, noncontact, three-dimensional inspection and quantitative surface topography measurement for both research and production applications.
Using ZYGO's patented scanning white-light interferometry technology, the NewView 600s easily measures a wide range of surfaces, including smooth, rough, flat, sloped and stepped surfaces. Key attributes include high-precision scanning, simplified operation, configuration flexibility, and advanced surface characterization - including comprehensive surface texture, step-height, PSD analysis, and much more. Simply put, the NewView 600s delivers optimal value, in combination with proven precision and quality, in a compact footprint.
The NewView™ 600p provides precise, low-cost 3D profiling on smooth surfaces. Based on phase-shifting interferometry, the NewView™ 600p is ideally suited for fast, high resolution measurements on various smooth surfaces, including optics, silicon wafers, ceramics, polished hard disks, and more. The system is exceptionally cost-effective and compact, conserving your budget and valuable floor space.
PRECISION – The NewView™ 600 Series continues to deliver the level of precision and quality that has become the trademark of ZYGO's NewView™ family of products. High resolution measurements, low system noise floor, optimal imaging quality, and robust system design enable superior performance and surface metrology capabilities in most any environment.
FLEXIBILITY – A key component of the NewView™ 600 Series is its configurability. Based on an open and modular architecture, the system easily accommodates a wide range of sample sizes, materials, and textures. Standard accessories include a complete line of high quality interferometric objectives, manual and motorized turrets, and sample positioning stages. Also, a convenient breadboard is available to accept application specific custom fixturing. Whether you need a versatile system with all the options, or a dedicated production setup, the NewView 600 can be configured to meet your needs.
SIMPLICITY – Many instruments claim to be easy to use but often fall short. Not the NewView™ 600! All measurements are fast, nondestructive and require no sample preparation. Areal surface data is rapidly acquired and processed, yielding more than 300,000 data points in seconds. Objectives are easily interchanged using quick-mount adapters or even faster when using a multi-position turret - providing you with the magnification, field-of-view, and resolution you need, when you need it. Ergonomically positioned coarse, medium, and fine focus knobs, an on-screen Live Display, and automatic light level adjustment expedite sample setup. With the NewView 600, you won't find yourself continually reaching for frequently used controls.
CHARACTERIZATION – And of course, the system is powered by ZYGO's comprehensive metrology software package, MetroPro, providing complete 3D and 2D surface characterization, visualization, and processing options. In addition to advanced analysis, user-friendly MetroPro® includes instrument control, password protection, statistical databasing, programmable scripting, customizable layout, pass/fail criteria, and much more.
Not exactly sure what features you need today, or what you'll need tomorrow? The NewView 600 Series offers a full range of options and upgrades to meet your metrology and budgetary requirements, protecting your investment for years. From cost-effective bench-top research tools, to dedicated production systems and sensors, the NewView™ 600 Series offers a complete metrology solution for today's leading-edge research and production applications.