α-SE™

 

alpha-Spectroscopic Ellipsometer

 

Fast, low-cost system for measuring film thickness and optical constants. Everything contained in amazingly small package. The ideal table top tool. Computer control through USB port.

 

 

 

 

 

 

 

EASY-TO-USE... push button operation with advanced software that takes care of the work for you.

 

FLEXIBLE... work with your materials - dielectrics, semiconductors, organics...

 

POWERFUL... proven SE technology gives you both thickness and index without the uncertainty of single-α ellipsometry or spectrophotometry. Measures depolarization and Mueller Matrix as well.

 

LOW COST... the power of SE at a much lower cost than a high-level research tool.

 

FAST... 100s of wavelengths simultaneously collected in seconds - immediate results.

 

 

Alpha-SE™ Software

Choose a model from a drop down list, a "Project" to save results in, and click "Measure" button. It's that simple!

 

Advanced Modeling Capabilities:

• Disperion models to describe any material-Cauchy, Sellmeier, Lorentz, Gaussian, Tauc-Lorentz, Drude, etc...
• Index Grading
• Surface/interfacial roughness

 

 

Specifications

• Spectral range: 380nm to 900nm (180 wavelengths)
• Angle of incidence: 65°, 70° and 75°
• Computer connection: USB (1.1 or higher)
• Automated sample height adjustment
• Data acquisition time:
  - 3 sec. (Fast mode)
  - 10 sec. (Standard mode)
  - 30 sec. (Long mode)

 

 

PDF Downloads

 

Alpha SE brochure