Conventional approaches to analysis of thermographic NDT data are based on visual or computer analysis of the images from the infrared camera. These methods are often difficult to interpret and limited in their ability to image deep or subtle features, or perform quantitative measurement.
TWI’s patented Thermographic Signal Reconstruction (TSR) method addresses these limitations, and allows an unprecedented degree of sensitivity, depth range and resolution of subsurface defects. The introduction of TSR has played a significant role in the growth of thermography in real-world manufacturing and in-service inspection applications.
Polymer film inserts in a graphite epoxy panel are not detectable in the raw infrared data sequence (top). However, the four inserts are clearly visible after TSR processing of the original data set.