VersaXRM-500

 

Industry's largest working distance at highest resolution

 

The Xradia VersaXRM family is the latest generation of 3D X-ray microscopy (XRM) solutions optimized for non-destructive micro tomography. The VersaXRM-500 advances industry and science with a versatile combination of world-leading resolution and contrast, sample flexibility and the large working distance required to address emerging research challenges. The system's source technology and high resolution detector provide unmatched sub-micron resolution, even for large samples.

 

Applications:

 

• Semiconductor process optimization and failure analysis
• Virtual core analysis for oil and gas exploration
• Stained and unstained hard and soft tissue studies
• Crack propagation and porosity studies
• In situ measurements and time-dependent (4D) studies

 

 

VersaXRM-500 – Highly Versatile X-ray Microscope

 

True Submicron Spatial Resolution at Millimeters to Inches from Source

Performance beyond micro-CT. The VersaXRM is an X-ray microscope, employing a turret of objectives. This design produces two-stage magnification, enabling the user to select magnification by changing objectives or by changing the geometric magnification. Traditional micro-CT systems are limited to just geometric magnification. The VersaXRM enables control over resolution and phase contrast across a wide range of sample sizes and a large working distance.

 

The VersaXRM builds on the superior resolution, contrast and versatility inherent in Xradia platforms, including true submicron spatial resolution-a better indicator of imaging quality than merely spot, pixel or voxel size, or detail detectability-even at millimeters or inches from the source. At the same time, it supports high resolution at large working distances suitable for in situ study using environmental chambers or load cells, and 4D (over time) or under varying environmental conditions.

 

Benefits

 

• Microscope design enables highest resolution at the largest working distance from the source, a prerequisite for in situ and large sample imaging
• Multi-length scale imaging of the same sample across a wide range of magnifications, down to <0.7 µm True Spatial Resolution™
• Supports a wide variety of in situ rigs for submicron imaging of practical sized samples (mm to inches) with weight capability up to 15 kg

 

All VersaXRM are equipped with robust, maintenance free closed tube X-ray sources, and highly stable and repeatable sample stages. In addition, these systems are designed to have significantly diminished cone angle artifact as opposed to traditional CT systems using flat panel detectors.

 

Applications

 

• Life Science Research
• Semiconductor Package Failure Analysis
• Advanced Material Development
• Oil & Gas Drilling Feasibility Studies